Hamamatsu Photonics Products
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Hamamatsu Photodiodes
Our photodiodes cover a broad spectral range, from near-infrared and ultraviolet wavelengths to high-energy regions. Photodiodes are available in metal, ceramic, and plastic packages, as well as module types. Custom designs are also available.
Silicon photodiodes with high sensitivity and low dark current, as well as silicon PIN photodiodes suitable for high-speed applications.
Manufacturer
|
Products Name |
Type |
Photosensitive
area
|
Spectral Response Range |
Photosensitive (Typ) |
Dark Current (Max) |
Rise Time (Typ) |
Cutıff frequency (Typ) |
Terminal capacitance (typ) |
Hamamatsu
|
Hamamatsu
Si photodiode
S12497
|
PWB with pins
|
9.5 × 9.5 mm
|
400 to 1100 nm
|
0.57 A/W
|
200 pA
|
15 μs
|
--
|
950 pF
|
Hamamatsu
|
Si photodiode
S12498
|
PWB with pins
|
6.0 × 6.0 mm
|
400 to 1100 nm
|
0.57 A/W
|
150 pA
|
15 μs
|
--
|
380 pF
|
Hamamatsu
|
Si photodiode
S12698-04
|
For UV to near IR:
IR sensitivity suppressed type
|
3.6 × 3.6 mm
|
190 to 1000 nm
|
0.38 A/W
|
50 pA
|
0.6 μs
|
--
|
240 pF
|
Hamamatsu
|
Si photodiode
S12915-1010R
|
For visible to near IR
|
10 × 10 mm
|
340 to 1100 nm
|
0.64 A/W
|
200 pA
|
--
|
--
|
13000 pF
|
Hamamatsu
|
Si photodiode
S12915-16R
|
For visible to near IR
|
1.1 × 5.9 mm
|
340 to 1100 nm
|
0.64 A/W
|
5 pA
|
1.8 μs
|
--
|
740 pF
|
Hamamatsu
|
Si photodiode
S12915-33R
|
For visible to near IR
|
2.4 × 2.4 mm
|
340 to 1100 nm
|
0.64 A/W
|
5 pA
|
1.6 μs
|
--
|
680 pF
|
Hamamatsu
|
Si photodiode
S12915-66R
|
For visible to near IR
|
5.8 × 5.8 mm
|
340 to 1100 nm
|
0.64 A/W
|
50 pA
|
9 μs
|
--
|
4000 pF
|
Hamamatsu
|
Si photodiode
S13954-01CT
|
For automotive
|
φ1.5 mm
|
320 to 1000 nm
|
0.49 A/W
|
1000 pA
|
--
|
230 MHz
|
13 pF
|
Hamamatsu
|
Si PIN photodiode
S13993
|
for direct radiation detection
|
10 × 10 mm
|
--
|
--
|
6000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
Si photodiode
S14016-01DT
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
1.8 × 2.1 mm
|
320 to 1100 nm
|
0.7 A/W
|
10000 pA
|
--
|
10 MHz
|
12 pF
|
Hamamatsu
|
Si PIN photodiode
S14536-320
|
for high-energy particles
|
48 × 48 mm
|
--
|
--
|
100000 pA
|
--
|
3 MHz
|
--
|
Hamamatsu
|
Si PIN photodiode
S14536-500
|
for high-energy particles
|
48 × 48 mm
|
--
|
--
|
200000 pA
|
--
|
5 MHz
|
--
|
Hamamatsu
|
Si PIN photodiode
S14537-320
|
for high-energy particles
|
28 × 28 mm
|
--
|
--
|
50000 pA
|
--
|
8 MHz
|
--
|
Hamamatsu
|
Si PIN photodiode
S14537-500
|
for high-energy particles
|
28 × 28 mm
|
--
|
--
|
100000 pA
|
--
|
10 MHz
|
--
|
Hamamatsu
|
Si PIN photodiode
S14605
|
for direct radiation detection
|
9 × 9 mm
|
--
|
--
|
30000 pA
|
--
|
20 MHz
|
25 pF
|
Hamamatsu
|
Si PIN photodiode
S15137
|
--
|
φ5.0 mm
|
360 to 1120 nm
|
0.52 A/W
|
10000 pA
|
0.0125 μs
|
--
|
10 pF
|
Hamamatsu
|
Si PIN photodiode
S15193
|
Cut-off frequency:
100 MHz to less than 500 MHz
|
φ0.8 mm
|
380 to 1000 nm
|
0.64 A/W
|
500 pA
|
--
|
100 MHz
|
2 pF
|
Hamamatsu
|
Si photodiode
S15289-33
|
CSP type
|
2.5 × 2.5 mm
|
190 to 1100 nm
|
0.54 A/W
|
300 pA
|
50 μs
|
--
|
70 pF
|
Hamamatsu
|
Si photodiode
S1087
|
For visible range
|
1.3 × 1.3 mm
|
320 to 730 nm
|
0.3 A/W
|
10 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
Si photodiode
S1087-01
|
For visible range to near IR
|
1.3 × 1.3 mm
|
320 to 1100 nm
|
0.58 A/W
|
10 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
Si photodiode
S1133
|
For visible range
|
2.8 × 2.4 mm
|
320 to 730 nm
|
0.3 A/W
|
10 pA
|
2.5 μs
|
--
|
700 pF
|
Hamamatsu
|
Si photodiode
S1133-01
|
For visible range to near IR
|
2.8 × 2.4 mm
|
320 to 1100 nm
|
0.58 A/W
|
10 pA
|
2.5 μs
|
--
|
700 pF
|
Hamamatsu
|
Si photodiode
S1133-14
|
For visible range to near IR
|
2.8 × 2.4 mm
|
320 to 1000 nm
|
0.4 A/W
|
20 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
Si PIN photodiode
S1223
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2.4 × 2.8 mm
|
320 to 1100 nm
|
0.52 A/W
|
10000 pA
|
--
|
30 MHz
|
10 pF
|
Hamamatsu
|
Si PIN photodiode
S1223-01
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
3.6 × 3.6 mm
|
320 to 1100 nm
|
0.52 A/W
|
10000 pA
|
--
|
20 MHz
|
20 pF
|
Hamamatsu
|
Si photodiode
S1226-18BK
|
For UV to near IR:
IR sensitivity suppressed type
|
1.1 × 1.1 mm
|
320 to 1000 nm
|
0.36 A/W
|
2 pA
|
0.15 μs
|
--
|
35 pF
|
Hamamatsu
|
Si photodiode
S1226-18BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
1.1 × 1.1 mm
|
190 to 1000 nm
|
0.36 A/W
|
2 pA
|
0.15 μs
|
--
|
35 pF
|
Hamamatsu
|
Si photodiode
S1226-44BK
|
For UV to near IR:
IR sensitivity suppressed type
|
3.6 × 3.6 mm
|
320 to 1000 nm
|
0.36 A/W
|
10 pA
|
1 μs
|
--
|
500 pF
|
Hamamatsu
|
Si photodiode
S1226-44BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
3.6 × 3.6 mm
|
190 to 1000 nm
|
0.36 A/W
|
10 pA
|
1 μs
|
--
|
500 pF
|
Hamamatsu
|
Si photodiode
S1226-5BK
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
320 to 1000 nm
|
0.36 A/W
|
5 pA
|
0.5 μs
|
--
|
160 pF
|
Hamamatsu
|
Si photodiode
S1226-5BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
190 to 1000 nm
|
0.36 A/W
|
5 pA
|
0.5 μs
|
--
|
160 pF
|
Hamamatsu
|
Si photodiode
S1226-8BK
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
320 to 1000 nm
|
0.36 A/W
|
20 pA
|
2 μs
|
--
|
1200 pF
|
Hamamatsu
|
Si photodiode
S1226-8BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
190 to 1000 nm
|
0.36 A/W
|
20 pA
|
2 μs
|
--
|
1200 pF
|
Hamamatsu
|
Si photodiode
S1227-1010BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
10 × 10 mm
|
190 to 1000 nm
|
0.36 A/W
|
50 pA
|
7 μs
|
--
|
3000 pF
|
Hamamatsu
|
Si photodiode
S1227-1010BR
|
For UV to near IR:
IR sensitivity suppressed type
|
10 × 10 mm
|
340 to 1000 nm
|
0.43 A/W
|
50 pA
|
7 μs
|
--
|
3000 pF
|
Hamamatsu
|
Si photodiode
S1227-16BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
5.9 × 1.1 mm
|
190 to 1000 nm
|
0.36 A/W
|
5 pA
|
0.5 μs
|
--
|
170 pF
|
Hamamatsu
|
Si photodiode
S1227-16BR
|
For UV to near IR:
IR sensitivity suppressed type
|
5.9 × 1.1 mm
|
340 to 1000 nm
|
0.43 A/W
|
5 pA
|
0.5 μs
|
--
|
170 pF
|
Hamamatsu
|
Si photodiode
S1227-33BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
190 to 1000 nm
|
0.36 A/W
|
5 pA
|
0.5 μs
|
--
|
160 pF
|
Hamamatsu
|
Si photodiode
S1227-33BR
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
340 to 1000 nm
|
0.43 A/W
|
5 pA
|
0.5 μs
|
--
|
160 pF
|
Hamamatsu
|
Si photodiode
S1227-66BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
190 to 1000 nm
|
0.36 A/W
|
20 pA
|
2 μs
|
--
|
950 pF
|
Hamamatsu
|
Si photodiode
S1227-66BR
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
340 to 1000 nm
|
0.43 A/W
|
20 pA
|
2 μs
|
--
|
950 pF
|
Hamamatsu
|
Si photodiode
S1336-18BK
|
For UV to near IR:
IR sensitivity suppressed type
|
1.1 × 1.1 mm
|
320 to 1100 nm
|
0.5 A/W
|
20 pA
|
0.1 μs
|
--
|
20 pF
|
Hamamatsu
|
Si photodiode
S1336-18BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
1.1 × 1.1 mm
|
190 to 1100 nm
|
0.5 A/W
|
20 pA
|
0.1 μs
|
--
|
20 pF
|
Hamamatsu
|
Si photodiode
S1336-44BK
|
For UV to near IR:
IR sensitivity suppressed type
|
3.6 × 3.6 mm
|
320 to 1100 nm
|
0.5 A/W
|
50 pA
|
0.5 μs
|
--
|
150 pF
|
Hamamatsu
|
Si photodiode
S1336-44BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
3.6 × 3.6 mm
|
190 to 1100 nm
|
0.5 A/W
|
50 pA
|
0.5 μs
|
--
|
150 pF
|
Hamamatsu
|
Si photodiode
S1336-5BK
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
320 to 1100 nm
|
0.5 A/W
|
30 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S1336-5BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
0.5 A/W
|
30 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S1336-8BK
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
320 to 1100 nm
|
0.5 A/W
|
100 pA
|
1 μs
|
--
|
380 pF
|
Hamamatsu
|
Si photodiode
S1336-8BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
0.5 A/W
|
100 pA
|
1 μs
|
--
|
380 pF
|
Hamamatsu
|
Si photodiode
S1337-1010BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
10 × 10 mm
|
190 to 1100 nm
|
0.5 A/W
|
200 pA
|
3 μs
|
--
|
1100 pF
|
Hamamatsu
|
Si photodiode
S1337-1010BR
|
For UV to near IR:
IR sensitivity suppressed type
|
10 × 10 mm
|
340 to 1100 nm
|
0.62 A/W
|
200 pA
|
3 μs
|
--
|
1100 pF
|
Hamamatsu
|
Si photodiode
S1337-16BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
5.9 × 1.1 mm
|
190 to 1100 nm
|
0.5 A/W
|
50 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S1337-16BR
|
For UV to near IR:
IR sensitivity suppressed type
|
5.9 × 1.1 mm
|
340 to 1100 nm
|
0.62 A/W
|
50 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S1337-21
|
For UV to near IR:
IR sensitivity suppressed type
|
18 × 18 mm
|
190 to 1100 nm
|
0.52 A/W
|
500 pA
|
8 μs
|
--
|
4000 pF
|
Hamamatsu
|
Si photodiode
S1337-33BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
0.5 A/W
|
30 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S1337-33BR
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
340 to 1100 nm
|
0.62 A/W
|
30 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S1337-66BQ
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
0.5 A/W
|
100 pA
|
1 μs
|
--
|
380 pF
|
Hamamatsu
|
Si photodiode
S1337-66BR
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
340 to 1100 nm
|
0.62 A/W
|
100 pA
|
1 μs
|
--
|
380 pF
|
Hamamatsu
|
Si photodiode
S1787-04
|
For visible range
|
2.8 × 2.4 mm
|
320 to 730 nm
|
0.3 A/W
|
10 pA
|
2.5 μs
|
--
|
700 pF
|
Hamamatsu
|
Si photodiode
S1787-08
|
For visible range to near IR
|
2.8 × 2.4 mm
|
320 to 1100 nm
|
0.58 A/W
|
10 pA
|
2.5 μs
|
--
|
700 pF
|
Hamamatsu
|
Si photodiode
S1787-12
|
For visible range to near IR
|
2.8 × 2.4 mm
|
320 to 1000 nm
|
0.35 A/W
|
20 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
Si photodiode
S2281
|
UV to near IR:
UV sensivity enhanced type
|
φ11.3 mm
|
190 to 1100 nm
|
0.5 A/W
|
500 pA
|
3 μs
|
--
|
1300 pF
|
Hamamatsu
|
Si photodiode
S2281-01
|
For UV to near IR:
IR sensitivity suppressed type
|
φ11.3 mm
|
190 to 1000 nm
|
0.36 A/W
|
300 pA
|
7 μs
|
--
|
3200 pF
|
Hamamatsu
|
Si photodiode
S2281-04
|
UV to near IR:
UV sensivity enhanced type
|
φ7.98 mm
|
190 to 1100 nm
|
0.5 A/W
|
500 pA
|
3 μs
|
--
|
1300 pF
|
Hamamatsu
|
Si photodiode
S2386-18K
|
For visible to near IR
|
1.1 × 1.1 mm
|
320 to 1100 nm
|
0.6 A/W
|
2 pA
|
0.4 μs
|
--
|
140 pF
|
Hamamatsu
|
Si photodiode
S2386-18L
|
For visible to near IR
|
1.1 × 1.1 mm
|
320 to 1100 nm
|
0.6 A/W
|
2 pA
|
0.4 μs
|
--
|
140 pF
|
Hamamatsu
|
Si photodiode
S2386-44K
|
For visible to near IR
|
3.6 × 3.6 mm
|
320 to 1100 nm
|
0.6 A/W
|
20 pA
|
3.6 μs
|
--
|
1600 pF
|
Hamamatsu
|
Si photodiode
S2386-45K
|
For visible to near IR
|
3.9 × 4.6 mm
|
320 to 1100 nm
|
0.6 A/W
|
30 pA
|
5.5 μs
|
--
|
2300 pF
|
Hamamatsu
|
Si photodiode
S2386-5K
|
For visible to near IR
|
2.4 × 2.4 mm
|
320 to 1100 nm
|
0.6 A/W
|
5 pA
|
1.8 μs
|
--
|
730 pF
|
Hamamatsu
|
Si photodiode
S2386-8K
|
For visible to near IR
|
5.8 × 5.8 mm
|
320 to 1100 nm
|
0.6 A/W
|
50 pA
|
10 μs
|
--
|
4300 pF
|
Hamamatsu
|
Si photodiode
S2387-1010R
|
For visible to near IR
|
10 × 10 mm
|
340 to 1100 nm
|
0.58 A/W
|
200 pA
|
33 μs
|
--
|
12000 pF
|
Hamamatsu
|
Si photodiode
S2387-130R
|
For visible to near IR
|
29.1 × 1.2 mm
|
340 to 1100 nm
|
0.58 A/W
|
100 pA
|
11 μs
|
--
|
5000 pF
|
Hamamatsu
|
Si photodiode
S2387-16R
|
For visible to near IR
|
5.9 × 1.1 mm
|
340 to 1100 nm
|
0.58 A/W
|
5 pA
|
1.8 μs
|
--
|
730 pF
|
Hamamatsu
|
Si photodiode
S2387-33R
|
For visible to near IR
|
2.4 × 2.4 mm
|
340 to 1100 nm
|
0.58 A/W
|
5 pA
|
1.8 μs
|
--
|
730 pF
|
Hamamatsu
|
Si photodiode
S2387-66R
|
For visible to near IR
|
5.8 × 5.8 mm
|
340 to 1100 nm
|
0.58 A/W
|
50 pA
|
10 μs
|
--
|
4300 pF
|
Hamamatsu
|
Si PIN photodiode
S2506-02
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2.77 × 2.77 mm
|
320 to 1100 nm
|
0.48 A/W
|
10000 pA
|
--
|
25 MHz
|
15 pF
|
Hamamatsu
|
Si PIN photodiode
S2506-04
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2.77 × 2.77 mm
|
760 to 1100 nm
|
0.56 A/W
|
10000 pA
|
--
|
25 MHz
|
15 pF
|
Hamamatsu
|
Si photodiode
S2551
|
UV to near IR:
UV sensivity enhanced type
|
1.2 × 29.1 mm
|
340 to 1060 nm
|
0.57 A/W
|
1000 pA
|
1.4 μs
|
--
|
350 pF
|
Hamamatsu
|
Si photodiode
S2592-03
|
TE-cooled type
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
0.5 A/W
|
38 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S2592-04
|
TE-cooled type
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
0.5 A/W
|
200 pA
|
1 μs
|
--
|
380 pF
|
Hamamatsu
|
Si PIN photodiode
S2744-08
|
Large active area Si PIN photodiode
|
20 × 10 mm
|
340 to 1100 nm
|
0.66 A/W
|
10000 pA
|
--
|
25 MHz
|
85 pF
|
Hamamatsu
|
Si photodiode
S2833-01
|
For visible to near IR
|
2.4 × 2.8 mm
|
320 to 1100 nm
|
0.58 A/W
|
10 pA
|
2.5 μs
|
--
|
700 pF
|
Hamamatsu
|
Si photodiode
S2833-04
|
For visible to near IR
|
2.4 × 2.8 mm
|
320 to 1100 nm
|
0.58 A/W
|
10 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
Si PIN photodiode
S3071
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ5 mm
|
320 to 1060 nm
|
0.54 A/W
|
10000 pA
|
--
|
40 MHz
|
18 pF
|
Hamamatsu
|
Si PIN photodiode
S3072
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ3 mm
|
320 to 1060 nm
|
0.54 A/W
|
10000 pA
|
--
|
45 MHz
|
7 pF
|
Hamamatsu
|
Si PIN photodiode
S3204-08
|
Large active area Si PIN photodiode
|
18 × 18 mm
|
340 to 1100 nm
|
0.66 A/W
|
20000 pA
|
--
|
20 MHz
|
130 pF
|
Hamamatsu
|
Si PIN photodiode
S3399
|
Cut-off frequency:
100 MHz to less than 500 MHz
|
φ3 mm
|
320 to 1000 nm
|
0.58 A/W
|
1000 pA
|
--
|
100 MHz
|
20 pF
|
Hamamatsu
|
Si photodiode
S3477-03
|
TE-cooled type
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
0.5 A/W
|
38 pA
|
0.2 μs
|
--
|
65 pF
|
Hamamatsu
|
Si photodiode
S3477-04
|
TE-cooled type
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
0.5 A/W
|
200 pA
|
1 μs
|
--
|
380 pF
|
Hamamatsu
|
Si PIN photodiode
S3584-08
|
Large active area Si PIN photodiode
|
28 × 28 mm
|
340 to 1100 nm
|
0.66 A/W
|
30000 pA
|
--
|
10 MHz
|
300 pF
|
Hamamatsu
|
S3588-08
Si PIN photodiode
|
Large active area Si PIN photodiode
|
30 × 3 mm
|
340 to 1100 nm
|
0.66 A/W
|
10000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
S3590-08
Si PIN photodiode
|
Large active area Si PIN photodiode
|
10 × 10 mm
|
340 to 1100 nm
|
0.66 A/W
|
6000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
S3590-09
Si PIN photodiode
|
Large active area Si PIN photodiode
|
10 × 10 mm
|
340 to 1100 nm
|
0.66 A/W
|
6000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
S3590-18
Si PIN photodiode
|
Large active area Si PIN photodiode
|
10 × 10 mm
|
340 to 1100 nm
|
0.65 A/W
|
10000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
S3590-19
Si PIN photodiode
|
Large active area Si PIN photodiode
|
10 × 10 mm
|
340 to 1100 nm
|
0.58 A/W
|
10000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
S3759
Si PIN photodiode
|
For YAG laser detection
|
φ5 mm
|
360 to 1120 nm
|
0.7 A/W
|
10000 pA
|
--
|
--
|
10 pF
|
Hamamatsu
|
S3883
Si PIN photodiode
|
Cut-off frequency:
100 MHz to less than 500 MHz
|
φ1.5 mm
|
320 to 1000 nm
|
0.58 A/W
|
1000 pA
|
--
|
300 MHz
|
6 pF
|
Hamamatsu
|
S3994-01
Si PIN photodiode
|
Violet and blue sensitivity enhanced type
|
10 × 10 mm
|
320 to 1100 nm
|
0.65 A/W
|
10000 pA
|
--
|
20 MHz
|
40 pF
|
Hamamatsu
|
S4011-06DS
Si photodiode
|
For visible to near IR
|
1.3 × 1.3 mm
|
320 to 1100 nm
|
0.58 A/W
|
10 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
S4707-01
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2.4 × 2.8 mm
|
320 to 1100 nm
|
0.6 A/W
|
5000 pA
|
--
|
20 MHz
|
14 pF
|
Hamamatsu
|
S4797-01
Si photodiode
|
For visible to near IR
|
1.3 × 1.3 mm
|
320 to 1000 nm
|
0.4 A/W
|
20 pA
|
0.2 μs
|
--
|
50 pF
|
Hamamatsu
|
S5106
Si PIN photodiode
|
High-speed response Si PIN photodiode
|
5 × 5 mm
|
320 to 1100 nm
|
0.72 A/W
|
5000 pA
|
--
|
20 MHz
|
40 pF
|
Hamamatsu
|
S5107
Si PIN photodiode
|
High-speed response Si PIN photodiode
|
10 × 10 mm
|
320 to 1100 nm
|
0.72 A/W
|
10000 pA
|
--
|
10 MHz
|
150 pF
|
Hamamatsu
|
S5627-01
Si photodiode
|
For visible
|
1.3 × 1.3 mm
|
320 to 840 nm
|
0.3 A/W
|
50 pA
|
2 μs
|
--
|
700 pF
|
Hamamatsu
|
S5821
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ1.2 mm
|
320 to 1100 nm
|
0.52 A/W
|
2000 pA
|
--
|
25 MHz
|
3 pF
|
Hamamatsu
|
S5821-01
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ1.2 mm
|
320 to 1100 nm
|
0.52 A/W
|
2000 pA
|
--
|
25 MHz
|
3 pF
|
Hamamatsu
|
S5821-02
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ1.2 mm
|
320 to 1100 nm
|
0.52 A/W
|
2000 pA
|
--
|
25 MHz
|
3 pF
|
Hamamatsu
|
S5821-03
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ1.2 mm
|
320 to 1100 nm
|
0.52 A/W
|
2000 pA
|
--
|
25 MHz
|
3 pF
|
Hamamatsu
|
S5971
Si PIN photodiode
|
Cut-off frequency:
100 MHz to less than 500 MHz
|
φ1.2 mm
|
320 to 1060 nm
|
0.55 A/W
|
1000 pA
|
--
|
100 MHz
|
3 pF
|
Hamamatsu
|
S5972
Si PIN photodiode
|
Cut-off frequency:
500 MHz to less than 1 GHz
|
φ0.8 mm
|
320 to 1000 nm
|
0.55 A/W
|
500 pA
|
--
|
500 MHz
|
3 pF
|
Hamamatsu
|
S5973
Si PIN photodiode
|
Cut-off frequency:
1 GHz or more
|
φ0.4 mm
|
320 to 1000 nm
|
0.51 A/W
|
100 pA
|
--
|
1000 MHz
|
1.6 pF
|
Hamamatsu
|
S5973-01
Si PIN photodiode
|
Cut-off frequency:
1 GHz or more
|
φ0.4 mm
|
320 to 1000 nm
|
0.51 A/W
|
100 pA
|
--
|
1000 MHz
|
1.6 pF
|
Hamamatsu
|
S5973-02
Si PIN photodiode
|
Cut-off frequency:
1 GHz or more
|
φ0.4 mm
|
320 to 1000 nm
|
0.42 A/W
|
100 pA
|
--
|
1000 MHz
|
1.6 pF
|
Hamamatsu
|
S6036
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ7 mm
|
320 to 1100 nm
|
0.56 A/W
|
10000 pA
|
--
|
25 MHz
|
15 pF
|
Hamamatsu
|
S6775
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
5.5 × 4.8 mm
|
320 to 1100 nm
|
0.55 A/W
|
10000 pA
|
--
|
15 MHz
|
40 pF
|
Hamamatsu
|
S6775-01
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
5.5 × 4.8 mm
|
700 to 1100 nm
|
0.68 A/W
|
10000 pA
|
--
|
15 MHz
|
40 pF
|
Hamamatsu
|
S6801-01
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ14 mm
|
700 to 1100 nm
|
0.55 A/W
|
10000 pA
|
--
|
15 MHz
|
40 pF
|
Hamamatsu
|
S6931-01
Si photodiode
|
For visible to near IR
|
2.4 × 2.8 mm
|
320 to 1000 nm
|
0.48 A/W
|
20 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
S6967
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
5.5 × 4.8 mm
|
320 to 1060 nm
|
0.65 A/W
|
5000 pA
|
--
|
50 MHz
|
50 pF
|
Hamamatsu
|
S7478
Si PIN photodiode
|
High-speed response Si PIN photodiode
|
5 × 5 mm
|
320 to 1100 nm
|
0.72 A/W
|
5000 pA
|
--
|
20 MHz
|
40 pF
|
Hamamatsu
|
S7509
Si PIN photodiode
|
High-speed response Si PIN photodiode
|
10 × 2 mm
|
320 to 1100 nm
|
0.72 A/W
|
5000 pA
|
--
|
20 MHz
|
40 pF
|
Hamamatsu
|
S7510
Si PIN photodiode
|
High-speed response Si PIN photodiode
|
11 × 6 mm
|
320 to 1100 nm
|
0.72 A/W
|
10000 pA
|
--
|
15 MHz
|
80 pF
|
Hamamatsu
|
S7686
Si photodiode
|
For visible
|
2.8 × 2.4 mm
|
480 to 660 nm
|
0.38 A/W
|
20 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
S8193
Si photodiode
|
With scintillator
|
5.8 × 5.8 mm
|
--
|
--
|
50 pA
|
--
|
--
|
950 pF
|
Hamamatsu
|
S8385
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2 × 2 mm
|
320 to 1100 nm
|
0.48 A/W
|
1000 pA
|
--
|
25 MHz
|
12 pF
|
Hamamatsu
|
S8553
Si photodiode
|
For excimerlaser detection
|
18 × 18 mm
|
--
|
0.06 A/W
|
5000 pA
|
18 μs
|
--
|
8000 pF
|
Hamamatsu
|
S8559
Si photodiode
|
With scintillator
|
5.8 × 5.8 mm
|
--
|
--
|
50 pA
|
--
|
--
|
950 pF
|
Hamamatsu
|
S8650
Si PIN photodiode
|
Large active area Si PIN photodiode
|
10 × 10 mm
|
340 to 1100 nm
|
0.66 A/W
|
6000 pA
|
--
|
40 MHz
|
40 pF
|
Hamamatsu
|
S8729
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2 × 3.3 mm
|
320 to 1100 nm
|
0.55 A/W
|
2000 pA
|
--
|
25 MHz
|
16 pF
|
Hamamatsu
|
S8729-04
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2 × 3.3 mm
|
760 to 1100 nm
|
0.68 A/W
|
2000 pA
|
--
|
25 MHz
|
16 pF
|
Hamamatsu
|
S8729-10
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2 × 3.3 mm
|
320 to 1100 nm
|
0.55 A/W
|
2000 pA
|
--
|
25 MHz
|
16 pF
|
Hamamatsu
|
S8745-01
Si photodiode with preamp
|
With preamp for measurement
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
--
|
--
|
--
|
--
|
--
|
Hamamatsu
|
S8746-01
Si photodiode with preamp
|
With preamp for measurement
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
--
|
--
|
--
|
--
|
--
|
Hamamatsu
|
S9055
Si PIN photodiode
|
Cut-off frequency:
1 GHz or more
|
φ0.2 mm
|
320 to 1000 nm
|
0.25 A/W
|
100 pA
|
--
|
1500 MHz
|
0.8 pF
|
Hamamatsu
|
S9055-01
Si PIN photodiode
|
Cut-off frequency:
1 GHz or more
|
φ0.1 mm
|
320 to 1000 nm
|
0.25 A/W
|
100 pA
|
--
|
2000 MHz
|
0.5 pF
|
Hamamatsu
|
S9195
Si PIN photodiode
|
Violet and blue sensitivity enhanced type
|
5 × 5 mm
|
320 to 1000 nm
|
0.28 A/W
|
5000 pA
|
--
|
50 MHz
|
60 pF
|
Hamamatsu
|
S9219
Si photodiode
|
For visible
|
φ11.3 mm
|
380 to 780 nm
|
0.24 A/W
|
500 pA
|
2.5 μs
|
--
|
1100 pF
|
Hamamatsu
|
S9219-01
Si photodiode
|
For visible
|
3.6 × 3.6 mm
|
380 to 780 nm
|
0.22 A/W
|
50 pA
|
0.5 μs
|
--
|
150 pF
|
Hamamatsu
|
S9295
Si photodiode with preamp
|
With preamp for measurement
|
10 × 10 mm
|
190 to 1100 nm
|
--
|
--
|
--
|
--
|
--
|
Hamamatsu
|
S9295-01
Si photodiode with preamp
|
With preamp for measurement
|
10 × 10 mm
|
190 to 1100 nm
|
--
|
--
|
--
|
--
|
--
|
Hamamatsu
|
S9674
Si photodiode
|
For automotive
|
2 × 2 mm
|
320 to 1100 nm
|
0.7 A/W
|
1000 pA
|
2 μs
|
--
|
500 pF
|
Hamamatsu
|
S9981-01CT
Si photodiode
|
For automotive
|
1.3 × 1.3 mm
|
320 to 1100 nm
|
0.65 A/W
|
1000 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
S10043
Si photodiode
|
For excimerlaser detection
|
10 × 10 mm
|
190 to 1000 nm
|
0.015 A/W
|
1000 pA
|
9 μs
|
--
|
4000 pF
|
Hamamatsu
|
S10625-01CT
Si photodiode
|
small package type
|
1.3 × 1.3 mm
|
320 to 1100 nm
|
0.54 A/W
|
10000 pA
|
0.5 μs
|
--
|
200 pF
|
Hamamatsu
|
S10783
Si PIN photodiode
|
Cut-off frequency:
100 MHz to less than 500 MHz
|
φ0.8 mm
|
330 to 1040 nm
|
0.52 A/W
|
1000 pA
|
--
|
250 MHz
|
4.5 pF
|
Hamamatsu
|
S10784
Si PIN photodiode
|
Cut-off frequency:
100 MHz to less than 500 MHz
|
φ3.0 mm
|
340 to 1040 nm
|
0.51 A/W
|
1000 pA
|
--
|
250 MHz
|
4.5 pF
|
Hamamatsu
|
S10993-02CT
Si PIN photodiode
|
Cut-off frequency:
5 MHz to less than 100 MHz
|
1.06 × 1.06 mm
|
380 to 1100 nm
|
0.6 A/W
|
1000 pA
|
--
|
10 MHz
|
6 pF
|
Hamamatsu
|
S11141-10
Si photodiode
|
For electron beam detector
|
10 x 10 mm
|
--
|
--
|
60000 pA
|
--
|
2.5 MHz
|
450 pF
|
Hamamatsu
|
S11142-10
Si photodiode
|
For electron beam detector
|
14 x 14 mm
|
--
|
--
|
60000 pA
|
--
|
5 MHz
|
200 pF
|
Hamamatsu
|
S12158-01CT
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
2.77 × 2.77 mm
|
320 to 1100 nm
|
0.7 A/W
|
10000 pA
|
--
|
25 MHz
|
15 pF
|
Hamamatsu
|
S12271
Si PIN photodiode
|
Cut-off frequency:
10 MHz to less than 100 MHz
|
φ4.1 mm
|
190 to 1100 nm
|
0.5 A/W
|
30000 pA
|
--
|
60 MHz
|
10 pF
|
Hamamatsu
|
S12698
Si photodiode
|
For UV to near IR:
IR sensitivity suppressed type
|
1.1 × 1.1 mm
|
190 to 1000 nm
|
0.38 A/W
|
10 pA
|
0.1 μs
|
--
|
25 pF
|
Hamamatsu
|
S12698-01
Si photodiode
|
For UV to near IR:
IR sensitivity suppressed type
|
2.4 × 2.4 mm
|
190 to 1000 nm
|
0.38 A/W
|
30 pA
|
0.5 μs
|
--
|
230 pF
|
Hamamatsu
|
S12698-02
Si photodiode
|
For UV to near IR:
IR sensitivity suppressed type
|
5.8 × 5.8 mm
|
190 to 1000 nm
|
0.38 A/W
|
100 pA
|
1.5 μs
|
--
|
700 pF
|
Hamamatsu
|
S12742-220
Si photodiode
|
For monochromatic light detection
|
3.6 × 3.6 mm
|
216 to 224 nm
|
0.006 A/W
|
25 pA
|
1 μs
|
--
|
500 pF
|
Hamamatsu
|
S12742-254
Si photodiode
|
For monochromatic light detection
|
3.6 × 3.6 mm
|
252 to 256 nm
|
0.018 A/W
|
25 pA
|
1 μs
|
--
|
500 pF
|
Hamamatsu
|
S12742-275
Si photodiode
|
For monochromatic light detection
|
3.6 × 3.6 mm
|
271 to 279 nm
|
0.01 A/W
|
25 pA
|
1 μs
|
--
|
500 pF
|
Hamamatsu
|
S13773
Si PIN photodiode
|
Cut-off frequency:
500 MHz to less than 1 GHz
|
φ0.8 mm
|
380 to 1000 nm
|
0.54 A/W
|
500 pA
|
--
|
500 MHz
|
3 pF
|
Hamamatsu
|
S13955-01
Si photodiode
|
CSP type
|
7.05 × 7.05 mm
|
400 to 1100 nm
|
0.61 A/W
|
1000 pA
|
15 μs
|
--
|
500 pF
|
Hamamatsu
|
S13956-01
Si photodiode
|
CSP type
|
2.5 × 2.5 mm
|
400 to 1100 nm
|
0.61 A/W
|
300 pA
|
15 μs
|
--
|
60 pF
|
Hamamatsu
|
S13957-01
Si photodiode
|
CSP type
|
4.5 × 4.5 mm
|
400 to 1100 nm
|
0.61 A/W
|
1000 pA
|
15 μs
|
--
|
|
Si photodiode arrays
Si photodiode array is a sensor with multiple Si photodiodes arranged in a single package. An image sensor can be configured by arranging multiple photodiodes. It can be used in a wide range of applications such as light position detection, imaging, and spectrophotometry.
Manufacturer
|
Part No
|
Product Name
|
Photosensitive area)
|
Number of elements
|
Reverse voltage (max.)
|
Spectral response range
|
Peak sensitivity wavelength (typ.)
|
Photosensitivity (typ.)
|
Dark current (max.)
|
Terminal capacitance (typ.)
|
Hamamatsu
|
S14833
|
Si PIN photodiode array
S14833
|
2.76 × 1.37 mm
|
6
|
30 V
|
340 to 1100 nm
|
960 nm
|
0.68 A/W
|
5000 pA
|
9 pF
|
Hamamatsu
|
S15158
|
Si PIN photodiode array
|
0.7 × 2.0 mm
|
16
|
30 V
|
380 to 1100 nm
|
960 nm
|
0.63 A/W
|
10000 pA
|
60 pF
|
Hamamatsu
|
S4111-16Q
|
Si photodiode array
|
0.9 × 1.45 mm
|
16
|
15 V
|
190 to 1100 nm
|
960 nm
|
0.58 A/W
|
5 pA
|
200 pF
|
Hamamatsu
|
S4111-16R
|
Si photodiode array
|
0.9 × 1.45 mm
|
16
|
15 V
|
340 to 1100 nm
|
960 nm
|
0.58 A/W
|
5 pA
|
200 pF
|
Hamamatsu
|
S4111-35Q
|
Si photodiode array
|
0.9 × 4.4 mm
|
35
|
15 V
|
190 to 1100 nm
|
960 nm
|
0.58 A/W
|
10 pA
|
550 pF
|
Hamamatsu
|
S4111-46Q
|
Si photodiode array
|
0.9 × 4.4 mm
|
46
|
15 V
|
190 to 1100 nm
|
960 nm
|
0.58 A/W
|
10 pA
|
550 pF
|
Hamamatsu
|
S4114-35Q
|
Si photodiode array
|
0.9 × 4.4 mm
|
35
|
15 V
|
190 to 1000 nm
|
800 nm
|
0.5 A/W
|
60 pA
|
35 pF
|
Hamamatsu
|
S4114-46Q
|
Si photodiode array
|
0.9 × 4.4 mm
|
46
|
15 V
|
190 to 1000 nm
|
800 nm
|
0.5 A/W
|
60 pA
|
35 pF
|
Hamamatsu
|
S8558
|
Si PIN photodiode array
|
0.7 × 2.0 mm
|
16
|
30 V
|
320 to 1100 nm
|
960 nm
|
0.72 A/W
|
1000 pA
|
5 pF
|
Hamamatsu
|
S11212-021
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
10 V
|
340 to 1100 nm
|
920 nm
|
0.61 A/W
|
30 pA
|
40 pF
|
Hamamatsu
|
S11212-121
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
10 V
|
--
|
--
|
--
|
30 pA
|
40 pF
|
Hamamatsu
|
S11212-321
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
10 V
|
--
|
--
|
--
|
30 pA
|
40 pF
|
Hamamatsu
|
S11212-421
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
10 V
|
--
|
--
|
--
|
30 pA
|
40 pF
|
Hamamatsu
|
S11299-021
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
--
|
340 to 1100 nm
|
920 nm
|
0.61 A/W
|
30 pA
|
40 pF
|
Hamamatsu
|
S11299-121
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
40 pF
|
Hamamatsu
|
S11299-321
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
40 pF
|
Hamamatsu
|
S11299-421
|
16-element Si photodiode array
|
1.175 × 2.0 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
40 pF
|
Hamamatsu
|
S12362-021
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
340 to 1100 nm
|
920 nm
|
0.61 A/W
|
50 pA
|
75 pF
|
Hamamatsu
|
S12362-121
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
--
|
--
|
--
|
50 pA
|
75 pF
|
Hamamatsu
|
S12362-321
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
--
|
--
|
--
|
50 pA
|
75 pF
|
Hamamatsu
|
S12362-421
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
--
|
--
|
--
|
50 pA
|
75 pF
|
Hamamatsu
|
S12363-021
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
340 to 1100 nm
|
920 nm
|
0.61 A/W
|
50 pA
|
75 pF
|
Hamamatsu
|
S12363-121
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
--
|
--
|
--
|
50 pA
|
75 pF
|
Hamamatsu
|
S12363-321
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
--
|
--
|
--
|
50 pA
|
75 pF
|
Hamamatsu
|
S12363-421
|
16-element Si photodiode array
|
2.2 × 2.7 mm
|
16
|
--
|
--
|
--
|
--
|
50 pA
|
75 pF
|
Hamamatsu
|
S12858-021
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
340 to 1100 nm
|
920 nm
|
0.61 A/W
|
30 pA
|
30 pF
|
Hamamatsu
|
S12858-122
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
30 pF
|
Hamamatsu
|
S12858-324
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
30 pF
|
Hamamatsu
|
S12858-422
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
30 pF
|
Hamamatsu
|
S12859-021
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
340 to 1100 nm
|
920 nm
|
0.61 A/W
|
30 pA
|
30 pF
|
Hamamatsu
|
S12859-122
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
30 pF
|
Hamamatsu
|
S12859-324
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
30 pF
|
Hamamatsu
|
S12859-422
|
16-element Si photodiode array
|
0.77 × 2.5 mm
|
16
|
--
|
--
|
--
|
--
|
30 pA
|
30 pF
|
Hamamatsu
|
S13620-02
|
64-element Si photodiode array
|
2.5 × 2.5 mm
|
64
|
10 V
|
400 to 1100 nm
|
960 nm
|
0.61 A/W
|
300 pA
|
60 pF
|
Hamamatsu Segmented Si photodiodes
Silicon PIN photodiodes consisting of 2 or 4 elements. Sensitive to UV and near-infrared ranges.
Manufacturer
|
Part No
|
Product Name
|
Element size (per 1 element)
|
Number of elements
|
Scintillator type
|
Package
|
Cooling
|
Reverse voltage (max.)
|
Spectral response range
|
Peak sensitivity wavelength (typ.)
|
Hamamatsu
|
S3096-02
|
Si PIN photodiode
|
1.2 x 3 mm
|
2-segment
|
Plastic
|
--
|
Non-cooled
|
320 to 1100 nm
|
960 nm
|
0.58 A/W
|
Hamamatsu
|
S4204
|
Si PIN photodiode
|
1 x 2 mm
|
2-segment
|
Plastic
|
--
|
Non-cooled
|
320 to 1100 nm
|
960 nm
|
0.65 A/W
|
Hamamatsu
|
S4349
|
Si PIN photodiode
|
3 x 3 mm
|
4-segment
|
Metal
|
TO-5
|
Non-cooled
|
190 to 1000 nm
|
720 nm
|
0.45 A/W
|
Hamamatsu
|
S5870
|
Si PIN photodiode
|
10 x 10 mm
|
2-segment
|
Ceramic
|
Surface mount type
|
Non-cooled
|
320 to 1100 nm
|
960 nm
|
0.72 A/W
|
Hamamatsu
|
S5980
|
Si PIN photodiode
|
5 x 5 mm
|
4-segment
|
Ceramic
|
Surface mount type
|
Non-cooled
|
320 to 1100 nm
|
960 nm
|
0.72 A/W
|
Hamamatsu
|
S5981
|
Si PIN photodiode
|
10 x 10 mm
|
4-segment
|
Ceramic
|
Surface mount type
|
Non-cooled
|
320 to 1100 nm
|
960 nm
|
0.72 A/W
|
Hamamatsu
|
S9345
|
Si PIN photodiode
|
1.5 x 5.6 mm
|
2-segment
|
Plastic
|
Surface mount type
|
Non-cooled
|
320 to 1100 nm
|
960 nm
|
0.55 A
|
Si strip detector
An SSD is a Si photodiode array with strips of photosensitive areas (PN junctions) with a width ranging from several micrometers to several tens of micrometers formed on a substrate. It can detect incident positions of high energy particles at the micron level.
Manufacturer
|
Part No
|
Product Name
|
Type
|
Si Thickness
|
Si crystal plane direction
|
Breakdown voltage min
|
Dark curent max
|
Full depletion voltage max
|
Defective strip rate max
|
Hamamatsu
|
S13804
|
Si strip detector
|
Poly Si-bias AC-readout
|
320 ±15 μm
|
<100>
|
200 V
|
3 μA
|
100 V
|
5 %
|
Hamamatsu Photodiode array circuits
Driver circuit for silicon photodiode arrays.
Hamamatsu C9004 Driver circuit for Si photodiode array
Silicon photodiode arrays combined with signal processing integrated circuits (IC). Driver circuits available for easy implementation.
Si photodiode arrays with amplifier
Silicon photodiode arrays combined with signal processing integrated circuits (IC). 64-256 ch arrays with or without scintillators. Driver circuits available for easy implementation.
Manufacturer
|
Part no
|
Product name
|
Image size
|
Number of effective pixels
|
Pixel size
|
Pixel pitch
|
Supply voltage
|
Scintillator
|
Spectral response range
|
Line rate max.
|
Charge amp feedback capacitance
|
Hamamatsu
|
S11865-128
|
Photodiode array with amplifier
|
51.2 x 0.6 mm
|
128 pixels
|
0.3 x 0.6 mm
|
0.4 mm
|
5 V
|
None
|
200 to 1000 nm
|
7568 lines/s
|
0.5 pF
|
Hamamatsu
|
S11865-128G
|
Photodiode array with amplifier
|
51.2 x 0.6 mm
|
128 pixels
|
0.3 x 0.6 mm
|
0.4 mm
|
5 V
|
Phosphor sheet
|
--
|
7568 lines/s
|
0.5 pF
|
Hamamatsu
|
S11865-256
|
Photodiode array with amplifier
|
51.2 x 0.3 mm
|
256 pixels
|
0.1 x 0.3 mm
|
0.2 mm
|
5 V
|
None
|
200 to 1000 nm
|
3844 lines/s
|
0.5 pF
|
Hamamatsu
|
S11865-256G
|
Photodiode array with amplifier
|
51.2 x 0.3 mm
|
256 pixels
|
0.1 x 0.3 mm
|
0.2 mm
|
5 V
|
Phosphor sheet
|
--
|
3844 lines/s
|
0.5 pF
|
Hamamatsu
|
S11865-64
|
Photodiode array with amplifier
|
51.2 x 0.8 mm
|
64 pixels
|
0.7 x 0.8 mm
|
0.8 mm
|
5 V
|
None
|
200 to 1000 nm
|
14678 lines/s
|
0.5 pF
|
Hamamatsu
|
S11865-64G
|
Photodiode array with amplifier
|
51.2 x 0.8 mm
|
64 pixels
|
0.7 x 0.8 mm
|
0.8 mm
|
5 V
|
Phosphor sheet
|
--
|
14678 lines/s
|
0.5 pF
|
Hamamatsu
|
S11866-128-02
|
Photodiode array with amplifier
|
102.4 x 0.8 mm
|
128 pixels
|
0.7 x 0.8 mm
|
0.8 mm
|
5 V
|
None
|
200 to 1000 nm
|
7568 lines/s
|
0.5 pF
|
Hamamatsu
|
S11866-128G-02
|
Photodiode array with amplifier
|
102.4 x 0.8 mm
|
128 pixels
|
0.7 x 0.8 mm
|
0.8 mm
|
5 V
|
Phosphor sheet
|
--
|
7568 lines/s
|
0.5 pF
|
Hamamatsu
|
S11866-64-02
|
Photodiode array with amplifier
|
102.4 x 1.6 mm
|
64 pixels
|
1.5 x 1.6 mm
|
1.6 mm
|
5 V
|
None
|
200 to 1000 nm
|
14678 lines/s
|
0.5 pF
|
Hamamatsu
|
S11866-64G-02
|
Photodiode array with amplifier
|
102.4 x 1.6 mm
|
64 pixels
|
1.5 x 1.6 mm
|
1.6 mm
|
5 V
|
Phosphor sheet
|
--
|
14678 lines/s
|
0.5 pF
|
Hamamatsu
|
S13885-128
|
Photodiode array with amplifier
|
51.2 x 0.6 mm
|
128 pixels
|
0.3 x 0.6 mm
|
0.4 mm
|
3.3 V
|
None
|
200 to 1000 nm
|
7568 lines/s
|
0.125 pF
|
Hamamatsu
|
S13885-128G
|
Photodiode array with amplifier
|
51.2 x 0.6 mm
|
128 pixels
|
0.3 x 0.6 mm
|
0.4 mm
|
3.3 V
|
Phosphor sheet
|
--
|
7568 lines/s
|
0.125 pF
|
Hamamatsu
|
S13885-256
|
Photodiode array with amplifier
|
51.2 x 0.3 mm
|
256 pixels
|
0.1 x 0.3 mm
|
0.2 mm
|
3.3 V
|
None
|
200 to 1000 nm
|
3844 lines/s
|
0.125 pF
|
Hamamatsu
|
S13885-256G
|
Photodiode array with amplifier
|
51.2 x 0.3 mm
|
256 pixels
|
0.1 x 0.3 mm
|
0.2 mm
|
3.3 V
|
Phosphor sheet
|
--
|
3844 lines/s
|
0.125 pF
|
Hamamatsu
|
S13886-128
|
Photodiode array with amplifier
|
102.4 x 0.8 mm
|
128 pixels
|
0.7 x 0.8 mm
|
0.8 mm
|
3.3 V
|
None
|
200 to 1000 nm
|
7568 lines/s
|
0.125 pF
|
Hamamatsu
|
S13886-128G
|
Photodiode array with amplifier
|
102.4 x 0.8 mm
|
128 pixels
|
0.7 x 0.8 mm
|
0.4 mm
|
3.3 V
|
Phosphor sheet
|
--
|
7568 lines/s
|
0.125 pF
|
Hamamatsu Driver circuits for photodiode array with amplifier
Driver circuits for photodiode arrays with amplifiers.
Hamamatsu C9118-01 Driver circuit for photodiode array with amplifier
Part no.
|
Product name
|
Spectral response range
|
Peak sensitivity wavelength (typ.)
|
Photosensitive area
|
Photosensitivity (typ.)
|
Cutoff frequency (typ.)
|
Terminal capacitance (typ.)
|
Noise equivalent power (typ.)
|
Package
|
G15553-003C
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.3 mm
|
1.1 A/W
|
600 MHz
|
5 pF
|
4×10-15 W/Hz1/2
|
Ceramic
|
G15553-005C
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.5 mm
|
1.1 A/W
|
200 MHz
|
15 pF
|
7×10-15 W/Hz1/2
|
Ceramic
|
G15553-010C
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ1.0 mm
|
1.1 A/W
|
60 MHz
|
55 pF
|
2×10-14 W/Hz1/2
|
Ceramic
|
G12183-210KA-03
|
InGaAs PIN photodiode
|
0.9 to 2.55 μm
|
2.3 μm
|
φ1.0 mm
|
1.3 A/W
|
4 MHz
|
500 pF
|
2×10-13 W/Hz1/2
|
Metal
|
G14448-003L
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.3 mm
|
0.95 A/W
|
600 MHz
|
5 pF
|
5×10-15 W/Hz1/2
|
Plastic
|
G10899-003K
|
InGaAs PIN photodiode
|
0.5 to 1.7 μm
|
1.55 μm
|
φ0.3 mm
|
1 A/W
|
300 MHz
|
10 pF
|
5×10-15 W/Hz1/2
|
Metal
|
G10899-005K
|
InGaAs PIN photodiode
|
0.5 to 1.7 μm
|
1.55 μm
|
φ0.5 mm
|
1 A/W
|
150 MHz
|
20 pF
|
9×10-15 W/Hz1/2
|
Metal
|
G10899-01K
|
InGaAs PIN photodiode
|
0.5 to 1.7 μm
|
1.55 μm
|
φ1.0 mm
|
1 A/W
|
45 MHz
|
70 pF
|
2×10-14 W/Hz1/2
|
Metal
|
G10899-02K
|
InGaAs PIN photodiode
|
0.5 to 1.7 μm
|
1.55 μm
|
φ2.0 mm
|
1 A/W
|
10 MHz
|
300 pF
|
3×10-14 W/Hz1/2
|
Metal
|
G10899-03K
|
InGaAs PIN photodiode
|
0.5 to 1.7 μm
|
1.55 μm
|
φ3.0 mm
|
1 A/W
|
5 MHz
|
600 pF
|
5×10-14 W/Hz1/2
|
Metal
|
G11193-02R
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.2 mm
|
1 A/W
|
1000 MHz
|
3 pF
|
3×10-15 W/Hz1/2
|
Ceramic
|
G11193-03R
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.3 mm
|
1 A/W
|
500 MHz
|
5 pF
|
4×10-15 W/Hz1/2
|
Ceramic
|
G11193-10R
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ1.0 mm
|
1 A/W
|
60 MHz
|
55 pF
|
1.4×10-14 W/Hz1/2
|
Ceramic
|
G12180-003A
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.3 mm
|
1.1 A/W
|
600 MHz
|
5 pF
|
4.2×10-15 W/Hz1/2
|
Metal
|
G12180-005A
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.5 mm
|
1.1 A/W
|
200 MHz
|
15 pF
|
7.0×10-15 W/Hz1/2
|
Metal
|
G12180-010A
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ1.0 mm
|
1.1 A/W
|
60 MHz
|
55 pF
|
1.4×10-14 W/Hz1/2
|
Metal
|
G12180-020A
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ2.0 mm
|
1.1 A/W
|
13 MHz
|
250 pF
|
2.8×10-14 W/Hz1/2
|
Metal
|
G12180-030A
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ3.0 mm
|
1.1 A/W
|
7 MHz
|
450 pF
|
4.4×10-14 W/Hz1/2
|
Metal
|
G12180-050A
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ5.0 mm
|
1.1 A/W
|
3 MHz
|
1000 pF
|
7.0×10-14 W/Hz1/2
|
Metal
|
G12180-110A
|
InGaAs PIN photodiode
|
0.9 to 1.67 μm
|
1.55 μm
|
φ1.0 mm
|
1.1 A/W
|
40 MHz
|
75 pF
|
2.0×10-15 W/Hz1/2
|
Metal
|
G12180-120A
|
InGaAs PIN photodiode
|
0.9 to 1.67 μm
|
1.55 μm
|
φ2.0 mm
|
1.1 A/W
|
13 MHz
|
250 pF
|
4.0×10-15 W/Hz1/2
|
Metal
|
G12180-130A
|
InGaAs PIN photodiode
|
0.9 to 1.67 μm
|
1.55 μm
|
φ3.0 mm
|
1.1 A/W
|
7 MHz
|
450 pF
|
4.9×10-15 W/Hz1/2
|
Metal
|
G12180-150A
|
InGaAs PIN photodiode
|
0.9 to 1.67 μm
|
1.55 μm
|
φ5.0 mm
|
1.1 A/W
|
3 MHz
|
1000 pF
|
8.6×10-15 W/Hz1/2
|
Metal
|
G12180-210A
|
InGaAs PIN photodiode
|
0.9 to 1.65 μm
|
1.55 μm
|
φ1.0 mm
|
1.1 A/W
|
40 MHz
|
75 pF
|
1.3×10-15 W/Hz1/2
|
Metal
|
G12180-220A
|
InGaAs PIN photodiode
|
0.9 to 1.65 μm
|
1.55 μm
|
φ2.0 mm
|
1.1 A/W
|
13 MHz
|
250 pF
|
2.7×10-15 W/Hz1/2
|
Metal
|
G12180-230A
|
InGaAs PIN photodiode
|
0.9 to 1.65 μm
|
1.55 μm
|
φ3.0 mm
|
1.1 A/W
|
7 MHz
|
450 pF
|
3.2×10-15 W/Hz1/2
|
Metal
|
G12180-250A
|
InGaAs PIN photodiode
|
0.9 to 1.65 μm
|
1.55 μm
|
φ5.0 mm
|
1.1 A/W
|
3 MHz
|
1000 pF
|
5.3×10-15 W/Hz1/2
|
Metal
|
G12181-003K
|
InGaAs PIN photodiode
|
0.9 to 1.9 μm
|
1.75 μm
|
φ0.3 mm
|
1.1 A/W
|
90 MHz
|
25 pF
|
2.0×10-14 W/Hz1/2
|
Metal
|
G12181-005K
|
InGaAs PIN photodiode
|
0.9 to 1.9 μm
|
1.75 μm
|
φ0.5 mm
|
1.1 A/W
|
35 MHz
|
70 pF
|
3.0×10-14 W/Hz1/2
|
Metal
|
G12181-010K
|
InGaAs PIN photodiode
|
0.9 to 1.9 μm
|
1.75 μm
|
φ1.0 mm
|
1.1 A/W
|
10 MHz
|
230 pF
|
6.0×10-14 W/Hz1/2
|
Metal
|
G12181-020K
|
InGaAs PIN photodiode
|
0.9 to 1.9 μm
|
1.75 μm
|
φ2.0 mm
|
1.1 A/W
|
2.5 MHz
|
1000 pF
|
1.5×10-13 W/Hz1/2
|
Metal
|
G12181-030K
|
InGaAs PIN photodiode
|
0.9 to 1.9 μm
|
1.75 μm
|
φ3.0 mm
|
1.1 A/W
|
1.5 MHz
|
2000 pF
|
2.0×10-13 W/Hz1/2
|
Metal
|
G12181-103K
|
InGaAs PIN photodiode
|
0.9 to 1.87 μm
|
1.75 μm
|
φ0.3 mm
|
1.1 A/W
|
140 MHz
|
22 pF
|
5.0×10-15 W/Hz1/2
|
Metal
|
G12181-105K
|
InGaAs PIN photodiode
|
0.9 to 1.87 μm
|
1.75 μm
|
φ0.5 mm
|
1.1 A/W
|
50 MHz
|
64 pF
|
7.0×10-15 W/Hz1/2
|
Metal
|
G12181-110K
|
InGaAs PIN photodiode
|
0.9 to 1.87 μm
|
1.75 μm
|
φ1.0 mm
|
1.1 A/W
|
16 MHz
|
200 pF
|
1.5×10-14 W/Hz1/2
|
Metal
|
G12181-120K
|
InGaAs PIN photodiode
|
0.9 to 1.87 μm
|
1.75 μm
|
φ2.0 mm
|
1.1 A/W
|
3.5 MHz
|
900 pF
|
3.5×10-14 W/Hz1/2
|
Metal
|
G12181-130K
|
InGaAs PIN photodiode
|
0.9 to 1.87 μm
|
1.75 μm
|
φ3.0 mm
|
1.1 A/W
|
1.8 MHz
|
1800 pF
|
5.0×10-14 W/Hz1/2
|
Metal
|
G12181-203K
|
InGaAs PIN photodiode
|
0.9 to 1.85 μm
|
1.75 μm
|
φ0.3 mm
|
1.1 A/W
|
150 MHz
|
20 pF
|
3.5×10-15 W/Hz1/2
|
Metal
|
G12181-205K
|
InGaAs PIN photodiode
|
0.9 to 1.85 μm
|
1.75 μm
|
φ0.5 mm
|
1.1 A/W
|
53 MHz
|
60 pF
|
5.0×10-15 W/Hz1/2
|
Metal
|
G12181-210K
|
InGaAs PIN photodiode
|
0.9 to 1.85 μm
|
1.75 μm
|
φ1.0 mm
|
1.1 A/W
|
17 MHz
|
195 pF
|
1.0×10-14 W/Hz1/2
|
Metal
|
G12181-220K
|
InGaAs PIN photodiode
|
0.9 to 1.85 μm
|
1.75 μm
|
φ2.0 mm
|
1.1 A/W
|
3.7 MHz
|
850 pF
|
2.5×10-14 W/Hz1/2
|
Metal
|
G12181-230K
|
InGaAs PIN photodiode
|
0.9 to 1.85 μm
|
1.75 μm
|
φ3.0 mm
|
1.1 A/W
|
1.9 MHz
|
1700 pF
|
3.5×10-14 W/Hz1/2
|
Metal
|
G12182-003K
|
InGaAs PIN photodiode
|
0.9 to 2.1 μm
|
1.95 μm
|
φ0.3 mm
|
1.2 A/W
|
90 MHz
|
25 pF
|
6.5×10-14 W/Hz1/2
|
Metal
|
G12182-005K
|
InGaAs PIN photodiode
|
0.9 to 2.1 μm
|
1.95 μm
|
φ0.5 mm
|
1.2 A/W
|
35 MHz
|
70 pF
|
1.5×10-13 W/Hz1/2
|
Metal
|
G12182-010K
|
InGaAs PIN photodiode
|
0.9 to 2.1 μm
|
1.95 μm
|
φ1.0 mm
|
1.2 A/W
|
10 MHz
|
230 pF
|
2.5×10-13 W/Hz1/2
|
Metal
|
G12182-020K
|
InGaAs PIN photodiode
|
0.9 to 2.1 μm
|
1.95 μm
|
φ2.0 mm
|
1.2 A/W
|
2.5 MHz
|
1000 pF
|
5.5×10-13 W/Hz1/2
|
Metal
|
G12182-030K
|
InGaAs PIN photodiode
|
0.9 to 2.1 μm
|
1.95 μm
|
φ3.0 mm
|
1.2 A/W
|
1.5 MHz
|
2000 pF
|
8.5×10-13 W/Hz1/2
|
Metal
|
G12182-103K
|
InGaAs PIN photodiode
|
0.9 to 2.07 μm
|
1.95 μm
|
φ0.3 mm
|
1.2 A/W
|
140 MHz
|
22 pF
|
1.5×10-14 W/Hz1/2
|
Metal
|
G12182-105K
|
InGaAs PIN photodiode
|
0.9 to 2.07 μm
|
1.95 μm
|
φ0.5 mm
|
1.2 A/W
|
50 MHz
|
64 pF
|
3.0×10-14 W/Hz1/2
|
Metal
|
G12182-110K
|
InGaAs PIN photodiode
|
0.9 to 2.07 μm
|
1.95 μm
|
φ1.0 mm
|
1.2 A/W
|
16 MHz
|
200 pF
|
5.5×10-14 W/Hz1/2
|
Metal
|
G12182-120K
|
InGaAs PIN photodiode
|
0.9 to 2.07 μm
|
1.95 μm
|
φ2.0 mm
|
1.2 A/W
|
3.5 MHz
|
900 pF
|
1.5×10-13 W/Hz1/2
|
Metal
|
G12182-130K
|
InGaAs PIN photodiode
|
0.9 to 2.07 μm
|
1.95 μm
|
φ3.0 mm
|
1.2 A/W
|
1.8 MHz
|
1800 pF
|
2.0×10-13 W/Hz1/2
|
Metal
|
G12182-203K
|
InGaAs PIN photodiode
|
0.9 to 2.05 μm
|
1.95 μm
|
φ0.3 mm
|
1.2 A/W
|
150 MHz
|
20 pF
|
1.0×10-14 W/Hz1/2
|
Metal
|
G12182-205K
|
InGaAs PIN photodiode
|
0.9 to 2.05 μm
|
1.95 μm
|
φ0.5 mm
|
1.2 A/W
|
53 MHz
|
60 pF
|
2.0×10-14 W/Hz1/2
|
Metal
|
G12182-210K
|
InGaAs PIN photodiode
|
0.9 to 2.05 μm
|
1.95 μm
|
φ1.0 mm
|
1.2 A/W
|
17 MHz
|
195 pF
|
4.0×10-14 W/Hz1/2
|
Metal
|
G12182-220K
|
InGaAs PIN photodiode
|
0.9 to 2.05 μm
|
1.95 μm
|
φ2.0 mm
|
1.2 A/W
|
3.7 MHz
|
850 pF
|
9.0×10-14 W/Hz1/2
|
Metal
|
G12182-230K
|
InGaAs PIN photodiode
|
0.9 to 2.05 μm
|
1.95 μm
|
φ3.0 mm
|
1.2 A/W
|
1.9 MHz
|
1700 pF
|
1.5×10-13 W/Hz1/2
|
Metal
|
G12183-003K
|
InGaAs PIN photodiode
|
0.9 to 2.6 μm
|
2.3 μm
|
φ0.3 mm
|
1.3 A/W
|
50 MHz
|
50 pF
|
4×10-13 W/Hz1/2
|
Metal
|
G12183-005K
|
InGaAs PIN photodiode
|
0.9 to 2.6 μm
|
2.3 μm
|
φ0.5 mm
|
1.3 A/W
|
20 MHz
|
140 pF
|
5×10-13 W/Hz1/2
|
Metal
|
G12183-010K
|
InGaAs PIN photodiode
|
0.9 to 2.6 μm
|
2.3 μm
|
φ1.0 mm
|
1.3 A/W
|
6 MHz
|
500 pF
|
1×10-12 W/Hz1/2
|
Metal
|
G12183-020K
|
InGaAs PIN photodiode
|
0.9 to 2.6 μm
|
2.3 μm
|
φ2.0 mm
|
1.3 A/W
|
1.5 MHz
|
1800 pF
|
2×10-12 W/Hz1/2
|
Metal
|
G12183-030K
|
InGaAs PIN photodiode
|
0.9 to 2.6 μm
|
2.3 μm
|
φ3.0 mm
|
1.3 A/W
|
0.8 MHz
|
4000 pF
|
3×10-12 W/Hz1/2
|
Metal
|
G12183-103K
|
InGaAs PIN photodiode
|
0.9 to 2.57 μm
|
2.3 μm
|
φ0.3 mm
|
1.3 A/W
|
70 MHz
|
44 pF
|
1×10-13 W/Hz1/2
|
Metal
|
G12183-105K
|
InGaAs PIN photodiode
|
0.9 to 2.57 μm
|
2.3 μm
|
φ0.5 mm
|
1.3 A/W
|
25 MHz
|
120 pF
|
1.5×10-13 W/Hz1/2
|
Metal
|
G12183-110K
|
InGaAs PIN photodiode
|
0.9 to 2.57 μm
|
2.3 μm
|
φ1.0 mm
|
1.3 A/W
|
7 MHz
|
440 pF
|
2.5×10-13 W/Hz1/2
|
Metal
|
G12183-120K
|
InGaAs PIN photodiode
|
0.9 to 2.57 μm
|
2.3 μm
|
φ2.0 mm
|
1.3 A/W
|
2 MHz
|
1500 pF
|
5.5×10-13 W/Hz1/2
|
Metal
|
G12183-130K
|
InGaAs PIN photodiode
|
0.9 to 2.57 μm
|
2.3 μm
|
φ3.0 mm
|
1.3 A/W
|
0.9 MHz
|
3400 pF
|
8.5×10-13 W/Hz1/2
|
Metal
|
G12183-203K
|
InGaAs PIN photodiode
|
0.9 to 2.55 μm
|
2.3 μm
|
φ0.3 mm
|
1.3 A/W
|
75 MHz
|
40 pF
|
7×10-14 W/Hz1/2
|
Metal
|
G12183-205K
|
InGaAs PIN photodiode
|
0.9 to 2.55 μm
|
2.3 μm
|
φ0.5 mm
|
1.3 A/W
|
28 MHz
|
110 pF
|
1×10-13 W/Hz1/2
|
Metal
|
G12183-210K
|
InGaAs PIN photodiode
|
0.9 to 2.55 μm
|
2.3 μm
|
φ1.0 mm
|
1.3 A/W
|
8 MHz
|
400 pF
|
2×10-13 W/Hz1/2
|
Metal
|
G12183-220K
|
InGaAs PIN photodiode
|
0.9 to 2.55 μm
|
2.3 μm
|
φ2.0 mm
|
1.3 A/W
|
2.3 MHz
|
1400 pF
|
4×10-13 W/Hz1/2
|
Metal
|
G12183-230K
|
InGaAs PIN photodiode
|
0.9 to 2.55 μm
|
2.3 μm
|
φ3.0 mm
|
1.3 A/W
|
1 MHz
|
3200 pF
|
6×10-13 W/Hz1/2
|
Metal
|
G13176-003P
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.3 mm
|
1 A/W
|
600 MHz
|
5 pF
|
5×10-15 W/Hz1/2
|
Plastic
|
G13176-010P
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ1.0 mm
|
1 A/W
|
60 MHz
|
55 pF
|
1.4×10-14 W/Hz1/2
|
Plastic
|
G6854-01
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ0.08 mm
|
0.95 A/W
|
2000 MHz
|
1 pF
|
2×10-15 W/Hz1/2
|
Metal
|
G8195-11
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
--
|
0.95 A/W
|
2000 MHz
|
1 pF
|
--
|
Pigtail
|
G8195-12
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
--
|
0.95 A/W
|
2000 MHz
|
1 pF
|
--
|
Pigtail
|
G8370-10
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ10.0 mm
|
1 A/W
|
0.1 MHz
|
20000 pF
|
6×10-13 W/Hz1/2
|
Ceramic
|
G8370-81
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ1.0 mm
|
1.1 A/W
|
35 MHz
|
90 pF
|
2×10-14 W/Hz1/2
|
Metal
|
G8370-82
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ2.0 mm
|
1.1 A/W
|
4 MHz
|
550 pF
|
4×10-14 W/Hz1/2
|
Metal
|
G8370-83
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ3.0 mm
|
1.1 A/W
|
2 MHz
|
1000 pF
|
6×10-14 W/Hz1/2
|
Metal
|
G8370-85
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
φ5.0 mm
|
1.1 A/W
|
0.6 MHz
|
3500 pF
|
1×10-13 W/Hz1/2
|
Metal
|
G9801-22
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
--
|
0.95 A/W
|
2000 MHz
|
1 pF
|
--
|
Receptacle
|
G9801-32
|
InGaAs PIN photodiode
|
0.9 to 1.7 μm
|
1.55 μm
|
--
|
0.95 A/W
|
2000 MHz
|
1 pF
|
--
|
Receptacle
|
G9820
|
InGaAs PIN photodiode with preamp
|
--
|
--
|
--
|
--
|
--
|
--
|
--
|
Metal
|
G9820-02
|
InGaAs PIN photodiode with preamp
|
--
|
--
|
--
|
--
|
--
|
--
|
--
|
Metal
|
G9821-32
|
InGaAs PIN photodiode with preamp
|
--
|
--
|
--
|
--
|
2100 MHz
|
--
|
--
|
Receptacle
|
G9822-11
|
InGaAs PIN photodiode with preamp
|
--
|
--
|
--
|
--
|
2100 MHz
|
--
|
--
|
Pigtail
|
G9822-12
|
InGaAs PIN photodiode with preamp
|
--
|
--
|
--
|
--
|
2100 MHz
|
--
|
--
|
Pigtail
|
G9821-22
|
InGaAs PIN photodiode with preamp
|
--
|
--
|
--
|
--
|
2100 MHz
|
--
|
--
|
Receptacle
|
InGaAs photodiode arrays
InGaAs linear arrays and segmented-type photodiodes.
Linear InGaAs photodiode arrays
One-dimensional linear arrays with equally spaced photosensors. Sensitive to near-infrared wavelengths.
G7150-16
|
InGaAs PIN photodiode array
|
0.45 x 1 mm
|
16
|
Non-cooled
|
0.9 to 1.7 μm
|
1.55 μm
|
0.95 A/W
|
25 nA
|
100 pF
|
G7151-16
|
InGaAs PIN photodiode array
|
0.08 x 0.2 mm
|
16
|
Non-cooled
|
0.9 to 1.7 μm
|
1.55 μm
|
0.95 A/W
|
1 nA
|
10 pF
|
G8909-01
|
InGaAs PIN photodiode array
|
φ0.08 mm
|
40
|
Non-cooled
|
0.9 to 1.7 μm
|
1.55 μm
|
0.95 A/W
|
0.2 nA
|
1.4 pF
|
G12430-016D
|
InGaAs PIN photodiode array
|
0.45 x 1 mm
|
16
|
Non-cooled
|
0.9 to 1.7 μm
|
1.55 μm
|
0.95 A/W
|
2.5 nA
|
60 pF
|
G12430-032D
|
InGaAs PIN photodiode array
|
0.2 x 1 mm
|
32
|
Non-cooled
|
0.9 to 1.7 μm
|
1.55 μm
|
0.95 A/W
|
1.25 nA
|
35 pF
|
G12430-046D
|
InGaAs PIN photodiode array
|
0.2 x 1 mm
|
46
|
Non-cooled
|
0.9 to 1.7 μm
|
1.55 μm
|
0.95 A/W
|
1.25 nA
|
35 pF
|
Part No
|
Product Name
|
Pixel size/element
|
Number of elements
|
Cooling
|
Spectral response range
|
Peak sensitivity wavelength (typ.)
|
Photosensitivity (typ.)
|
Dark current (max.)
|
Terminal capacitance (typ.)
|
Segmented InGaAs photodiodes
4-segmented InGaAs PIN photodiodes sensitive in the near-infrared region. The photosensitive area is divided in two dimensions. Suitable for applications such as laser optical axis alignment.
Hamamatsu InGaAs PIN photodiode G6849
Hamamatsu InGaAs PIN photodiode G6849-01
Photodiode modules
High-precision photodetectors that integrate a silicon, InGaAs, or InAsSb photodiode and a current-to-voltage amplifier.
Part No
|
|
|
|
|
|
|
|
|
|
Hamamatsu
|
C10439-15
|
Photodiode module
|
2.4 × 2.4 (Si), φ1 (InGaAs) mm
|
320 to 2600 nm
|
940 (Si), 2300 (InGaAs) nm
|
Analog
|
Low range: 1 × 106 V/A
|
Low range: 100000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-01
|
Photodiode module
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
960 nm
|
Analog
|
Low range: 1 × 107 V/A
|
Low range: 1000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-02
|
Photodiode module
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
960 nm
|
Analog
|
Low range: 1 × 107 V/A
|
Low range: 1000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-03
|
Photodiode module
|
10 × 10 mm
|
190 to 1100 nm
|
960 nm
|
Analog
|
Low range: 1 × 107 V/A
|
Low range: 1000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-07
|
Photodiode module
|
2.4 × 2.4 mm
|
190 to 1100 nm
|
960 nm
|
Analog
|
Low range: 1 × 104 V/A
|
Low range: 100000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-08
|
Photodiode module
|
5.8 × 5.8 mm
|
190 to 1100 nm
|
960 nm
|
Analog
|
Low range: 1 × 104 V/A
|
Low range: 100000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-09
|
Photodiode module
|
10 × 10 mm
|
190 to 1100 nm
|
960 nm
|
Analog
|
Low range: 1 × 104 V/A
|
Low range: 100000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-10
|
Photodiode module
|
Φ1 mm
|
500 to 1700 nm
|
1550 nm
|
Analog
|
Low range: 1 × 104 V/A
|
Low range: 100000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-11
|
Photodiode module
|
Φ3 mm
|
500 to 1700 nm
|
1550 nm
|
Analog
|
Low range: 1 × 104 V/A
|
Low range: 100000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10439-14
|
Photodiode module
|
0.7 × 0.7 mm
|
- to 5300 nm
|
4100 nm
|
Analog
|
Low range: 1 × 106 V/A
|
Low range: 1000 Hz
|
±5 to ±12 V
|
Hamamatsu
|
C10475
|
Signal processing unit for photodiode module
|
--
|
--
|
--
|
--
|
--
|
--
|
--
|
Current-to-voltage conversion amplifiers that make our photodiodes easier to use.
Hamamatsu Photosensor amplifier C6386-01
Hamamatsu Photosensor amplifier C8366
Hamamatsu Photosensor amplifier C8366-01
Hamamatsu Photosensor amplifier C9051
Hamamatsu Photosensor amplifier C9329
Modules composed of silicon photodiodes, beam splitters, filters, and a current-to-voltage conversion circuit.
Designed for absorbance measurement requiring high blocking performance and low noise.
Hamamatsu Optics module C13398-02
Hamamatsu Evaluation circuit for optics module C13390
Hamamatsu Optics module C13390
These are differential amplification type photoelectric conversion modules containing two
Hamamatsu photodiodes with balanced characteristics. Used in applications such as opthalmologic diagnosis.
Hamamatsu Balanced detector C12668-01
Hamamatsu Balanced detector C12668-02
Hamamatsu Balanced detector C12668-03
Hamamatsu Balanced detector C12668-04
Multi-Pixel Photon Counters (MPPCs/SiPMs)
Our Multi-Pixel Photon Counter (MPPC), also known as silicon photomultiplier (SiPM),
is a solid state photomultiplier comprised of a high density matrix of Geiger-mode-operated avalanche photodiodes also known as SPAD (single-photon avalanche photodiode).
These SPADs have high internal gain which enable single photon detection.
The Hamamatsu SiPM features low dark count, high photon detection efficiency, excellent timing resolution,
low bias voltage operation, ruggedness, resistance to excess light, and immunity to magnetic fields. They are well-suited to single photon counting and other ultra-low light applications
MPPCs (SiPMs)/MPPC arrays
Single MPPCs (SiPMs) and multi-channel MPPCs
MPPC S14160 series
The S14160 series is a small-pixel MPPC that features wide dynamic range.
It employs minute pixels (10 µm, 15 µm) and provides low crosstalk, low dark count, and high fill factor.
MPPC -1310PS series
MPPC -1315PS series
MPPC -3010PS series
MPPC3015PS series
MPPC S14160/S14161 series
The S14160/S14161 series are MPPCs that feature high detection efficiency and low operating voltage for radiation monitors and
PET scanners. The dead space between channels has been reduced, and the space around the
photosensitive area has been reduced to 0.2 mm from the edges. The shape is suitable for four-side buttable tiling
MPPC S13360/S13362 series
These MPPCs are for precision measurement featuring high photon detection efficiency as well as low crosstalk,
low afterpulses, and low dark count.
MPPC S13615/S13360/S13361 series
These MPPCs are for precision measurement employing a TSV structure.
These are suitable for multi-channel placement with tiling
S13615 series
S13360-VE series
S13361-2050 series
S13361-3050 series
S13361-6050 series
MPPC S14420/S14422 series
These MPPCs features high photon detection efficiency in the visible to near infrared regions.
The lineup includes uncooled type S14420 series and the cooling type S14422 series.
S14420 series
S14422 series
MPPC S13720 series
LiDAR
The S13720 series is an MPPC with high sensitivity in the near infrared region that is used in LiDAR.
Hamamatsu MPPC power supplies & driver circuits
Power supplies and driver circuits for MPPCs. Power supplies have a built-in temperature compensation function to stabilize
MPPC operation in environments with fluctuating temperatures
Hamamatsu Power supply for MPPC C14156
Hamamatsu Power supply for MPPC C11204-01
Hamamatsu Power supply for MPPC C11204-02
Hamamatsu Evaluation circuit for MPPC C12332-01
MPPC modules
Modules (SiPM modules) that contain an MPPC capable of detecting extremely low-level light
C14452-1550GA
|
MPPC module
|
S14422-1550MG
|
Non-cooled
|
1 ch
|
φ1.5 mm
|
724
|
50 μm
|
Analog output
|
C14452-3050GA
|
MPPC module
|
S14422-1550MG
|
Non-cooled
|
1 ch
|
φ3 mm
|
2836
|
50 μm
|
Analog output
|
C14455-1550GA
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
φ1.5 mm
|
724
|
50 μm
|
Analog output
|
C14455-1550GD
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
φ1.5 mm
|
724
|
50 μm
|
Digital output
|
C14455-3050GA
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
φ3 mm
|
2836
|
50 μm
|
Analog output
|
C14455-3050GD
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
φ3 mm
|
2836
|
50 μm
|
Digital output
|
C14456-1550GA
|
MPPC module
|
S14420-1550DG
|
TE-cooled
|
1 ch
|
φ1.5 mm
|
724
|
50 μm
|
Analog output
|
C14456-1550GD
|
MPPC module
|
S14422-1550DG
|
TE-cooled
|
1 ch
|
φ1.5 mm
|
724
|
50 μm
|
Digital output
|
C14456-3050GA
|
MPPC module
|
S14422-3050DG
|
TE-cooled
|
1 ch
|
φ3 mm
|
2836
|
50 μm
|
Analog output
|
C14456-3050GD
|
MPPC module
|
S14422-3050DG
|
TE-cooled
|
1 ch
|
φ3 mm
|
2836
|
50 μm
|
Digital output
|
C11209-110
|
MPPC module
|
S12571-010C
|
Non-cooled
|
1 ch
|
1 x 1 mm
|
10000
|
10 μm
|
Analog output
|
C13365-1350SA
|
MPPC module
|
S13360-1350CS
|
Non-cooled
|
1 ch
|
1.3 x 1.3 mm
|
667
|
50 μm
|
Analog output
|
C13365-3050SA
|
MPPC module
|
S13360-3050CS
|
Non-cooled
|
1 ch
|
3 x 3 mm
|
3600
|
50 μm
|
Analog output
|
C13366-1350GA
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
1.3 x 1.3 mm
|
667
|
50 μm
|
Analog output
|
C13366-1350GD
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
1.3 x 1.3 mm
|
667
|
50 μm
|
Digital output
|
C13366-3050GA
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
3 x 3 mm
|
3600
|
50 μm
|
Analog output
|
C13366-3050GD
|
MPPC module
|
TE-cooled MPPC
|
TE-cooled
|
1 ch
|
3 x 3 mm
|
3600
|
50 μm
|
Digital output
|
C13368-3050EA-16
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (1 x 16) ch
|
3 x 3 mm
|
3584
|
50 μm
|
Analog output
|
C13368-3050ED-16
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (1 x 16) ch
|
3 x 3 mm
|
3584
|
50 μm
|
Digital output
|
C13368-3050EM-16
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (1 x 16) ch
|
3 x 3 mm
|
3584
|
50 μm
|
MCA type
|
C13369-1025GA-04
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (4 x 4) ch
|
1 x 1 mm
|
1584
|
25 μm
|
Analog output
|
C13369-1025GD-04
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (4 x 4) ch
|
1 x 1 mm
|
1584
|
25 μm
|
Digital output
|
C13369-1025GM-04
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (4 x 4) ch
|
1 x 1 mm
|
1584
|
25 μm
|
MCA type
|
C13369-3050EA-04
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (4 x 4) ch
|
3 x 3 mm
|
3584
|
50 μm
|
Analog output
|
C13369-3050ED-04
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (4 x 4) ch
|
3 x 3 mm
|
3584
|
50 μm
|
Digital output
|
C13369-3050EM-04
|
MPPC module
|
MPPC array
|
Non-cooled
|
16 (4 x 4) ch
|
3 x 3 mm
|
3584
|
50 μm
|
MCA type
|
C13367-1350EA
|
MPPC module
|
MPPC
|
Non-cooled
|
1 ch
|
1.3 x 1.3 mm
|
667
|
50 μm
|
Analog output
|
C13367-3050EA
|
MPPC module
|
MPPC
|
Non-cooled
|
1 ch
|
3 x 3 mm
|
3600
|
50 μm
|
Analog output
|
C13367-6050EA
|
MPPC module
|
MPPC
|
Non-cooled
|
1 ch
|
6 x 6 mm
|
14400
|
50 μm
|
Analog output
|
C13852-1350GA
|
MPPC module
|
S13362-1350DG
|
TE-cooled
|
1 ch
|
1.3 x 1.3 mm
|
667
|
50 μm
|
Analog output
|
C13852-1350GD
|
MPPC module
|
S13362-1350DG
|
TE-cooled
|
1 ch
|
1.3 x 1.3 mm
|
667
|
50 μm
|
Digital output
|
C13852-3050GA
|
MPPC module
|
S13362-3050DG
|
TE-cooled
|
1 ch
|
3 x 3 mm
|
3600
|
50 μm
|
Analog output
|
C13852-3050GD
|
MPPC module
|
S13362-3050DG
|
TE-cooled
|
1 ch
|
3 x 3 mm
|
3600
|
50 μm
|
Digital output
|
Part no.
|
Product name
|
Built-in sensor
|
Cooling
|
Number of channels
|
Effective photosensitive area/ch
|
Number of pixels/ch
|
Pixel pitch
|
Note
|
Hamamatsu Single-pixel photon counting modules
Photon counting modules integrating our Single-Pixel Photon Counter (SPPC) for low-level light detection. SPPCs are type of single-photon avalanche diode (SPAD).
Part No |
Product name |
Cooling |
Spectral rasponse range (min./max.) |
Dark count (typ) |
Photon detection efficiency (typ) |
Fiber connector |
Note |
C14463-050GD
|
Photon counting module
|
TE-cooled
|
370 to 1000
|
0.02 kcps
|
35 %
|
FC
|
Digital output
|
C11202-050
|
Photon counting module
|
TE-cooled
|
320 to 900
|
0.007 kcps
|
70 %
|
--
|
Digital output
|
C11202-100
|
Photon counting module
|
TE-cooled
|
320 to 900
|
0.03 kcps
|
70 %
|
--
|
Digital output
|
C13001-01
|
Photon counting module
|
TE-cooled
|
370 to 900
|
0.007 kcps
|
45 %
|
FC
|
Digital output
|
C14076-01
|
Photon counting module
|
TE-cooled
|
370 to 900
|
0.007 kcps
|
45 %
|
FC
|
Fiber coupling type
|
Hamamatsu Avalanche photodiodes (APDs)
APDs are photodiodes with internal gain produced by the application of a reverse voltage. They have a higher signal-to-noise ratio (SNR) than PIN photodiodes, as well as fast time response, low dark current, and high sensitivity
Avalanche photodiodes (APDs)
APDs are photodiodes with internal gain produced by the application of a reverse voltage. They have a higher signal-to-noise ratio (SNR) than PIN photodiodes, as well as fast time response, low dark current, and high sensitivity. Spectral response range is typically within 200 - 1150 nm
Si APDs
Silicon APDs provide high sensitivity ranging from UV to NIR for low light detection at high speeds
Part No |
Product Name |
Photosensitive area |
Type |
Spectral response range |
Peak sensitivy wavelength (typ) |
Breakdown voltage (typ) |
Temparature coefficient of breakdown voltage (typ) |
S14124-20
|
Si APD
|
φ2.0 mm
|
Short wavelength type
(low terminal capacitance)
|
--
|
600 nm
|
400 V
|
0.78 V/℃
|
S2384
|
Si APD
|
φ3 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S2385
|
Si APD
|
φ5 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S3884
|
Si APD
|
φ1.5 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S5344
|
Si APD
|
φ3 mm
|
Short wavelength type
(Low bias operation)
|
200 to 1000 nm
|
620 nm
|
150 V
|
0.14 V/℃
|
S5345
|
Si APD
|
φ5 mm
|
Short wavelength type
(Low bias operation)
|
200 to 1000 nm
|
620 nm
|
150 V
|
0.14 V/℃
|
S6045-04
|
Si APD
|
φ1.5 mm
|
Near infrared type
(Low temperature coefficient)
|
400 to 1000 nm
|
800 nm
|
200 V
|
0.4 V/℃
|
S6045-05
|
Si APD
|
φ3 mm
|
Near infrared type
(Low temperature coefficient)
|
400 to 1000 nm
|
800 nm
|
200 V
|
0.4 V/℃
|
S6045-06
|
Si APD
|
φ5 mm
|
Near infrared type
(Low temperature coefficient)
|
400 to 1000 nm
|
800 nm
|
200 V
|
0.4 V/℃
|
S8664-02K
|
Si APD
|
φ0.2 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-05K
|
Si APD
|
φ0.5 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-1010
|
Si APD
|
10 × 10 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-10K
|
Si APD
|
φ1 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-20K
|
Si APD
|
φ2 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-30K
|
Si APD
|
φ3 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-50K
|
Si APD
|
φ5 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8664-55
|
Si APD
|
5 × 5 mm
|
Short wavelength type
(low terminal capacitance)
|
320 to 1000 nm
|
600 nm
|
400 V
|
0.78 V/℃
|
S8890-02
|
Si APD
|
φ0.2 mm
|
Near infrared type
|
400 to 1100 nm
|
940 nm
|
500 V
|
3.5 V/℃
|
S8890-05
|
Si APD
|
φ0.5 mm
|
Near infrared type
|
400 to 1100 nm
|
940 nm
|
500 V
|
3.5 V/℃
|
S8890-10
|
Si APD
|
φ1 mm
|
Near infrared type
|
400 to 1100 nm
|
940 nm
|
500 V
|
3.5 V/℃
|
S8890-15
|
Si APD
|
φ1.5 mm
|
Near infrared type
|
400 to 1100 nm
|
940 nm
|
500 V
|
3.5 V/℃
|
S8890-30
|
Si APD
|
φ3 mm
|
Near infrared type
|
400 to 1100 nm
|
940 nm
|
500 V
|
3.5 V/℃
|
S9075
|
Si APD
|
φ1.5 mm
|
Short wavelength type
(low bias operation)
|
200 to 1000 nm
|
620 nm
|
150 V
|
0.14 V/℃
|
S9251-10
|
Si APD
|
φ1 mm
|
Near infrared type
(900 nm band, low terminal capacitance)
|
440 to 1100 nm
|
860 nm
|
250 V
|
1.85 V/℃
|
S9251-15
|
Si APD
|
φ1.5 mm
|
Near infrared type
(900 nm band, low terminal capacitance)
|
440 to 1100 nm
|
860 nm
|
250 V
|
1.85 V/℃
|
S12023-02
|
Si APD
|
φ0.2 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S12023-05
|
Si APD
|
φ0.5 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S12023-10
|
Si APD
|
φ1 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S12023-10A
|
Si APD
|
φ1 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S12051
|
Si APD
|
φ0.5 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S12053-02
|
Si APD
|
φ0.2 mm
|
Short wavelength type
(Low bias operation)
|
200 to 1000 nm
|
620 nm
|
150 V
|
0.14 V/℃
|
S12053-05
|
Si APD
|
φ0.5 mm
|
Short wavelength type
(Low bias operation)
|
200 to 1000 nm
|
620 nm
|
150 V
|
0.14 V/℃
|
S12053-10
|
Si APD
|
φ1 mm
|
Short wavelength type
(Low bias operation)
|
200 to 1000 nm
|
620 nm
|
150 V
|
0.14 V/℃
|
S12060-02
|
Si APD
|
φ0.2 mm
|
Near infrared type
(Low temperature coefficient)
|
400 to 1000 nm
|
800 nm
|
200 V
|
0.4 V/℃
|
S12060-05
|
Si APD
|
φ0.5 mm
|
Near infrared type
(Low temperature coefficient)
|
400 to 1000 nm
|
800 nm
|
200 V
|
0.4 V/℃
|
S12060-10
|
Si APD
|
φ1 mm
|
Near infrared type
(Low temperature coefficient)
|
400 to 1000 nm
|
800 nm
|
200 V
|
0.4 V/℃
|
S12086
|
Si APD
|
φ0.5 mm
|
Near infrared type
(Low bias operation)
|
400 to 1000 nm
|
800 nm
|
150 V
|
0.65 V/℃
|
S12092-02
|
Si APD
|
φ0.2 mm
|
Near infrared type
(900 nm band, low terminal capacitance)
|
440 to 1100 nm
|
860 nm
|
250 V
|
1.85 V/℃
|
S12092-05
|
Si APD
|
φ0.5 mm
|
Near infrared type
(900 nm band, low terminal capacitance)
|
440 to 1100 nm
|
860 nm
|
250 V
|
1.85 V/℃
|
S12426-02
|
Si APD
|
φ0.2 mm
|
High-speed type
(for 900 nm, Low bias operation)
|
400 to 1100 nm
|
840 nm
|
160 V
|
1.1 V/℃
|
S12426-05
|
Si APD
|
φ0.5 mm
|
High-speed type
(for 900 nm, Low bias operation)
|
400 to 1100 nm
|
840 nm
|
160 V
|
1.1 V/℃
|
APD modules
Our modules take the complexity out of operating an APD with a low-noise amplifier circuit, high voltage power supply, and temperature compensation circuit integrated into a compact solution.
C5658
|
APD module
|
High-speed type
|
φ0.5 mm
|
0.05 MHz
|
1000 MHz
|
2.50 × 105 V/W
|
±5.0 %
|
Non-cooled
|
+12.0 V
|
C10508-01
|
APD module
|
High-stability type
|
φ1.0 mm
|
DC MHz
|
10 MHz
|
1.25 × 107 V/W
|
±5.0 max. %
|
Non-cooled
|
±5 V
|
C12702-03
|
APD module
|
Near infrared type
|
φ1.0 mm
|
0.0040 MHz
|
100 MHz
|
-6.8 × 104 V/W
|
±2.5 %
|
Non-cooled
|
+5.0 V
|
C12702-04
|
APD module
|
Near infrared type
|
φ3.0 mm
|
0.0040 MHz
|
80 MHz
|
-2.30 × 104 V/W
|
±2.5 %
|
Non-cooled
|
+5.0 V
|
C12702-11
|
APD module
|
Short wavelength type
|
φ1.0 mm
|
0.0040 MHz
|
100 MHz
|
-2.5 × 104 V/W
|
±2.5 %
|
Non-cooled
|
+5.0 V
|
C12702-12
|
APD module
|
Short wavelength type
|
φ3.0 mm
|
0.0040 MHz
|
40 MHz
|
-1.9 × 104 V/W
|
±2.5 %
|
Non-cooled
|
+5.0 V
|
C12703
|
APD module
|
High-sensitivity type
|
φ1.5 mm
|
DC MHz
|
10 MHz
|
1.50 × 106 V/W
|
±2.5 %
|
Non-cooled
|
±12 V
|
C12703-01
|
APD module
|
High-sensitivity type
|
φ3.0 mm
|
DC MHz
|
0.1 MHz
|
-1.50 × 108 V/W
|
±2.5 %
|
Non-cooled
|
±12 V
|
Part no.
|
Product name
|
Type
|
Effective photosensitive area
|
Low Band Cut-off Frequency (typ.)
|
High Band Cut-off Frequency (typ.)
|
Photoelectric sensitivity (typ.)
|
Temperature stability of gain (typ.)
|
Cooling
|
Supply voltage (typ.)
|
Hamamatsu InGaAs APD G14858-0020AA
Hamamatsu InGaAs APD G8931-04
Hamamatsu InGaAs APD G8931-10
Hamamatsu InGaAs APD G8931-20
Hamamatsu Si APD arrays
4 × 8 element Si APD array with low noise and enhanced short-wavelength sensitivity
Hamamatsu Si APD array S8550-02
Hamamatsu Photo IC
The photo IC is an intelligent optical sensor with diverse functions and integrates a photodiode with signal processing IC in the same package.
Hamamatsu Photo IC for rangefinders
Photo IC for distance measurement using time-of-flight (TOF).
Hamamatsu Photo IC for rangefinder S13021-01CT
Illuminance sensors
Illuminance sensors combine signal processing circuits and a photodiode with spectral sensitivity close to that of the human eye. Suitable for applications such as energy-saving sensors for TVs or light dimmers for liquid crystal panels and cell phones.
Hamamatsu Light-to-frequency converter photo IC S9705
Hamamatsu Light-to-frequency converter photo IC S9705-01DT
Hamamatsu Photo IC diode S11153-01MT
Hamamatsu Photo IC diode S7183
Hamamatsu Photo IC diode S7184
Hamamatsu Photo IC diode S9066-211SB
Hamamatsu Photo IC diode S9067-201CT
Hamamatsu Photo IC diode S10604-200CT
Hamamatsu Photo IC diode S11154-201CT
Hamamatsu Photo IC diode S13948-01SB
Hamamatsu Photo IC for optical link
Photo IC receivers and emitters for plastic optical fiber communications.
Hamamatsu Transmitter photo IC for optical link L11354-01
Hamamatsu Photo IC for optical link P11379-04AT
Hamamatsu Receiver photo IC for optical link S11355-04
Hamamatsu Red LED for optical link L10881
Hamamatsu Photo IC for optical link L12422-01SR
Hamamatsu Photo IC for optical link L12557-01SR
Hamamatsu Receiver photo IC for optical link S7141-10
Hamamatsu Receiver photo IC for optical link S7727
Hamamatsu Receiver photo IC for optical link S8046
Hamamatsu Photo IC for optical link S12423-01SR
Hamamatsu Photo IC for laser beam synchronous detection
These photo ICs detect laser beam printing start timing in laser beam printers and digital copiers
Hamamatsu S11257-01DT Photo IC for laser beam synchronous detection
Hamamatsu S11257-02DT Photo IC for laser beam synchronous detection
Hamamatsu S11282-01DS Photo IC for laser beam synchronous detection
Hamamatsu S9684 Photo IC for laser beam synchronous detection
Hamamatsu S9684-01 Photo IC for laser beam synchronous detection
Hamamatsu S9703-11 Photo IC for laser beam synchronous detection
Hamamatsu S10317 Photo IC for laser beam synchronous detection
Hamamatsu S10317-01 Photo IC for laser beam synchronous detection
Hamamatsu Photosensor with front-end IC
Devices that integrate a photosensor, such as a photodiode or avalanche photodiode (APD), and front-end integrated circuit (IC) that reads the signals from the photosensor. Suitable for rangefinders because of their excellent noise and frequency characteristics.
Hamamatsu Photosensor with front-end IC S14137-01CR
Hamamatsu Photosensor with front-end IC S14847-01CR
Hamamatsu Photosensor with front-end IC S13282-01CR
Hamamatsu Photosensor with front-end IC S13645-01CR
Hamamatsu Schmitt trigger circuit photo IC
These devices integrate a photodiode, amplifier, Schmitt trigger circuit, and output phototransistor into a single chip. Their peak sensitivity is 850 nm, making them suitable for applications such as optical switches and rotary encoders.
Hamamatsu Schmitt trigger circuit photo IC S12558-02DT
Hamamatsu Schmitt trigger circuit photo IC S4810
Hamamatsu Schmitt trigger circuit photo IC S6289
Hamamatsu Schmitt trigger circuit photo IC S7610-10
Hamamatsu Schmitt trigger circuit photo IC S12558-01DT
Hamamatsu Photo IC devices for encoders
These are a photo IC and photo IC module for encoders.
Hamamatsu Photo IC for encoder
Photo IC having two pairs of monolithic photodiodes. Two-phase digital output makes it easier to configure optical encoders
Hamamatsu Photo IC for encoder S4506
Hamamatsu Encoder modules
An interrupter-type encoder module consisting of a photo IC sensor and red LED
Hamamatsu Encoder module P11159-201AS
Hamamatsu Photo IC assemblies for flame detection
Photo IC sensors designed specifically for flame detection (flame eye) in oil-fired hot water boilers and heaters. Since they don’t use conventional CdS cells, these products are RoHS compliant.
Hamamatsu Photo IC diode assembly S10108
Hamamatsu Photo IC diode assembly S10109
Hamamatsu Color sensors
Devices sensitive in the red, green, and blue spectral regions.
Hamamatsu RGB color sensors
Color sensors molded into plastic packages, with 3-channel photodiodes sensitive to the red, green, and blue (RGB) regions of the spectrum
Manufacturer
|
Part No |
Product Name |
Product Type |
Hamamatsu |
S13683-03DT
|
I2C interface-compatible color sensor
|
RGB digital color sensor
|
Hamamatsu |
S13683-04DS
|
I2C interface-compatible color sensor
|
RGB digital color sensor
|
Hamamatsu |
S9706
|
Color sensor
|
RGB digital color sensor
|
Hamamatsu |
S10917-35GT
|
RGB Color Sensor
|
RGB photodiode
|
Hamamatsu |
S10942-01CT
|
RGB Color Sensor
|
RGB photodiode
|
Hamamatsu |
S11012-01CR
|
Color sensor
|
RGB digital color sensor
|
Hamamatsu |
S7505-01
|
RGB Color Sensor
|
RGB photodiode
|
Hamamatsu |
S9032-02
|
RGB Color Sensor
|
RGB photodiode
|
Hamamatsu |
S9702
|
RGB Color Sensor
|
RGB photodiode
|
Hamamatsu |
S13683-02WT
|
I2C interface-compatible color sensor
|
RGB digital color sensor
|
Hamamatsu Color sensor circuits
Driver circuit boards for color sensor evaluation
Hamamatsu Color sensor evaluation circuit C9331
Hamamatsu Monochromatic color detectors
Color sensors designed to detect monochromatic colors of blue (λp=460 nm), green (λp=540 nm), or red (λp=660 nm)
Hamamatsu Si photodiode S6428-01
Hamamatsu Si photodiode S6429-01
Hamamatsu Si photodiode S6430-01
Hamamatsu Color sensor modules
Modules consisting of an RGB color sensor and an amplifier mounted on a small circuit board.
Hamamatsu Color sensor module C9303-03
Hamamatsu Color sensor module C9303-04
Hamamatsu Mini-spectrometers
Mini-spectrometers are compact and low cost spectrometers (polychromators). We offer over 20 different types of mini-spectrometers covering the spectral range from UV to NIR. Suitable for applications such as environmental measurement, color measurement, quality control in production lines, and information devices.
Hamamatsu Mini-spectrometer TF series C14214MA
Hamamatsu Mini-spectrometer TG series C9405CC
Hamamatsu Mini-spectrometer MS series C10988MA-01
Hamamatsu Mini-spectrometer MS series C11708MA
Hamamatsu Mini-spectrometer micro series C12880MA
Hamamatsu Mini-spectrometer TF series C13053MA
Hamamatsu Mini-spectrometer TF series C13054MA
Hamamatsu Mini-spectrometer TF series C13555MA
Hamamatsu Mini-spectrometer SMD series C14384MA-01
Hamamatsu Mini-spectrometer TF series C14486GA
Hamamatsu Mini-spectrometer TG series C9404CA
Hamamatsu Mini-spectrometer TG series C9404CAH
Hamamatsu Mini-spectrometer TG series C9913GC
Hamamatsu Mini-spectrometer TG series C9914GB
Hamamatsu Mini-spectrometer TM series C10082CA
Hamamatsu Mini-spectrometer TM series C10082CAH
Hamamatsu Mini-spectrometer TM series C10082MD
Hamamatsu Mini-spectrometer TM series C10083CA
Hamamatsu Mini-spectrometer TM series C10083CAH
Hamamatsu Mini-spectrometer RC series C11007MA
Hamamatsu Mini-spectrometer RC series C11008MA
Hamamatsu Mini-spectrometer RC series C11009MA
Hamamatsu Mini-spectrometer RC series C11010MA
Hamamatsu Mini-spectrometer TG series C11118GA
Hamamatsu Mini-spectrometer RC series C11482GA
Hamamatsu Mini-spectrometer TM series C11697MB
Hamamatsu Mini-spectrometer TG series C11713CA
Hamamatsu MEMS-FPI spectroscopic module
Spectroscopic module is a compact module integrating with MEMS-FPI spectrum sensor and light source. Spectrum and absorbance can be measured by connecting a PC via USB.
Hamamatsu MEMS-FPI spectroscopic module C15712
Hamamatsu MEMS-FPI spectroscopic module C15713
Hamamatsu MEMS-FPI spectroscopic module C15714
Hamamatsu Multichannel spectral system
Real time multichannel spectrometers.
Hamamatsu PMA-12 Photonic multichannel analyzer
Compact multichannel analyzer consists of a spectrograph and a high sensitivity detector in one package. Various models are available to accommodate a wide range of spectrum and sensitivity requirements
Hamamatsu PMA-12 Photonic multichannel analyzer
The PMA-12 is compact spectral measurement apparatus that combines a spectrometer and optical detector into one unit.
An optical fiber is used. Because of the high sensitivity, spectra can be obtained easily just by bringing the optical fiber close to the sample in normal applications, without a special light collection system. Since the spectrometer and photo-detector are fixed, the PMA-12 is stable and can be used with confidence for long periods of time. The wavelength axis and spectral response characteristics are already calibrated, so spectral measurements can be carried out easily and accurately.
Hamamatsu PMA-12 Photonic multichannel analyzer: C14880-01
This model realizes low stray light and enables highly accurate spectrum analysis by reviewing the optical layout.
Hamamatsu PMA-12 Photonic multichannel analyzer: C14631-01
The C14631, which has the thermoelectric cooling type as BT- CCD linear image sensor used for astronomical observation, realizes both high performance and low price by rational design.
Hamamatsu PMA-12 Photonic multichannel analyzer: C14631-02
The C14631, which has the thermoelectric cooling type as BT- CCD linear image sensor used for astronomical observation, realizes both high performance and low price by rational design.
Hamamatsu PMA-12 Photonic multichannel analyzer: C14631-03
The C14631, which has the thermoelectric cooling type as BT- CCD linear image sensor used for astronomical observation, realizes both high performance and low price by rational design.
Hamamatsu PMA-12 Photonic multichannel analyzer: C10027-01
This model uses a thermoelectrically cooled, back-thinned CCD linearimage sensor that with higher sensitivity and lower noise.
Hamamatsu PMA-12 Photonic multichannel analyzer: C10027-02
This model uses a thermoelectrically cooled, back-thinned CCD linearimage sensor that with higher sensitivity and lower noise.
Hamamatsu PMA-12 Photonic multichannel analyzer: C10028-01
These are models using InGaAs linear image sensors and capable of measurements of reflection and absorption spectra in the near infrared with a large dynamic range.
Hamamatsu PMA-12 Photonic multichannel analyzer: C10028-02
These are models using InGaAs linear image sensors and capable ofmeasurements of reflection and absorption spectra in the near infraredwith a large dynamic range.
Hamamatsu PMA-12 Photonic multichannel analyzer: C10029-01
Coupling an image intensifier with a thermoelectrically cooled, back-thinned CCD linear image sensor, it is possible to have both high-speed gate measurements at a maximum of 10 ns and ultra-high sensitivity.
Hamamatsu Fluorescence lifetime / transient absorption analysis system
Measurement systems of multispectrum kinetic changes at high sensitivity and high time resolution.
Hamamatsu Quantaurus-Tau Fluorescence lifetime spectrometer
Quantaurus-Tau is a compact system for measuring fluorescence lifetimes in the sub nanosecond to millisecond range.
Operation is simple, just set the sample into the sample chamber, and enter a few conditions on the measurement software to measure the fluorescence lifetime and PL spectrum in a short time with high precision. In a typical measurement, analysis results are obtained in a mere 60 seconds.
Hamamatsu Quantaurus-Tau Fluorescence lifetime spectrometer: C11367-31
Standard model. (Sample: Solution・Thin-film, Wavelength range: 300 nm to 800 nm)
Hamamatsu Quantaurus-Tau Fluorescence lifetime spectrometer: C11367-32
NIR model. (Sample: Solution・Thin-film, Wavelength range: 380 nm to 1030 nm)
Hamamatsu Quantaurus-Tau Fluorescence lifetime spectrometer: C11367-34
Standard model. (Sample: Solid (Thin-film・Powder), Wavelength range: 300 nm to 800 nm)
Hamamatsu Quantaurus-Tau Fluorescence lifetime spectrometer: C11367-35
NIR model. (Sample: Solid (Thin-film・Powder), Wavelength range: 380 nm to 1030 nm)
Hamamatsu Time-resolved absorption spectrum analysis system
The time-resolved absorption spectrum analysis system is a device to perform transient absorption spectrum measurements in extremely short time.
This system enables to analyze the formation and decay process of a reactive intermediate in a photoreaction in solutions, solids, membranes, etc are possible. By using the streak camera as the detector and performing multiple-wavelengths time-resolved measurements with a single shot, time-resolved absorption spectra and transient absorption time-resolved spectral images can be measured simultaneously, and you can obtain images of irreversible phenomenon.
Hamamatsu Time-resolved absorption spectrum analysis system: Nanosecond system
Time-resolved absorption spectrum analysis system for nanosecond range with time resolution of 7 ns at measurement time from 20 ns to 1 ms.
Hamamatsu Time-resolved absorption spectrum analysis system: Picosecond system
Time-resolved absorption spectrum analysis system for picosecond range with time resolution of 70 ps at measurement time from 0.5 ns to 20 ms.
Hamamatsu Picosecond fluorescence lifetime measurement system
Picosecond fluorescence lifetime measurement system has been developed in response to the requirements of researchers studying such materials. The use of a ''streak camera'', an optical transient recorder with picosecond time response, makes ultra-fast time-resolved spectrophotometry a reality. The use of streak camera technology allows detection sensitivities in the photon counting region. For simultaneous wavelength and time measurements, a spectrometer can be added to the system. Measurement parameters such as wavelength and time settings are controlled by a computer for simplified laboratory use.
Hamamatsu Picosecond fluorescence lifetime measurement system: C11200
The Hamamatsu Picosecond fluorescence lifetime measurement system has been developed in response to the requirements of researchers studying such materials.
Hamamatsu Flash photolysis system
The flash photolysis system can perform transient absorption measurements within the short nanosecond range.
The absorption spectrum of the formation and decay process of intermediaries in photoreactions such as photodissociation, photoisomerization reaction, etc can be observed. Due to the newly developed software added with the adoption of the optics, transient absorption spectrum measurements in the nanosecond range have been made easier.
Hamamatsu Flash photolysis system
-
ns to ms
-
Transient absorption
Flash photolysis system to perform transient absorption spectrum measurements
The flash photolysis system can perform transient absorption measurements within the short nanosecond range. The absorption spectrum of the formation and decay process of intermediaries in photoreactions such as photodissociation, photoisomerization reaction, etc can be observed. Due to the newly developed software added with the adoption of the optics, transient absorption spectrum measurements in the nanosecond range have been made easier.
Hamamatsu Compact NIR PL lifetime spectrometer
The compact NIR PL lifetime spectrometer C12132 series is designed for measuring photoluminescence (PL) spectrum and PL lifetime in the NIR region. Applicable to measure PL lifetime and PL spectrum of material which is related to the conversion efficiency of solar cell, PL lifetime of organic compound and PL spectrum of singlet oxygen.
Hamamatsu Compact NIR PL lifetime spectrometer: C12132-36
-
Laser class 1 model
-
580 nm to 1650 nm
Complies with laser class 1. It can be used outside of a laser controlled area.
Hamamatsu Compact NIR PL lifetime spectrometer: C12132-37
-
Laser class 3B model
-
580 nm to 1650 nm
Complies with laser class 3B. It is upgradable for multipoint measurement with optical fibers.
Hamamatsu Compact NIR PL lifetime spectrometer: C12132-38
- Uses an external laser
- 380 nm to 1650 nm
Uses an external laser as the excitation light source. Adding the PLP-10 laser diode head as an excitation light source is anoption.
Hamamatsu Image sensors
We offer over 200 standard linear and area image sensors covering the short wavelength infrared (SWIR), near infrared (NIR), visible (VIS), ultraviolet (UV), and X-ray regions. With a broad selection from high speed, high sensitivity to wide dynamic range, our image sensors are suitable for different applications including spectroscopy analysis using spectrometers, industrial imaging such as machine vision cameras, microscopy, and distance measurements. We also provide supporting electronics such as easy-to-use driver circuits for sensor evaluation and driver modules for OEMs. Customizations are available for specific applications and requirements.
Hamamatsu CCD / CMOS / NMOS image sensors
CCD/CMOS/NMOS image sensors for UV-VIS-NIR used for semiconductors, analytical instrumentation, spectroscopy applications and color measurement.
-
Line sensors
-
Area sensors
Hamamatsu InGaAs image sensors
Hamamatsu provides InGaAs image sensor options covering the visible (VIS), near infrared (NIR), and short wavelength infrared (SWIR) regions, and they have a built-in CMOS IC, allowing easy operation.
-
Line sensors
-
Area sensors
Hamamatsu X-ray image sensors
These are CCD/CMOS/NMOS image sensor for X-ray detection.
-
Line sensors
-
Area image sensors
Hamamatsu X-ray flat panel sensors
X-ray flat panel sensors that combine a large-area CMOS image sensor and a fiber optic plate with scintillator (FOS). Can acquire high-definition, megapixel-level digital video and still images without distortion. Easy to install into other equipment.
Hamamatsu Distance image sensors
Image sensors designed to measure distance to an object by the time-of-flight (TOF) method.
Hamamatsu Si photodiode arrays with amplifier
Silicon photodiode arrays combined with signal processing integrated circuits (IC). 64-256 ch arrays with or without scintillators. Driver circuits available for easy implementation.
Hamamatsu Image sensor circuits & accessories
Driver circuits and multi-channel detector heads to use with the associated data acquisition software for plug-and-play sensor characterization.
-
Driver circuits for CCD image sensors
-
Driver circuits for CMOS image sensors
-
Driver circuits for NMOS image sensors
-
Driver circuits for InGaAs image sensors
-
Driver circuits for photodiode array with amplifier
-
Multichannel detector head controllers
Hamamatsu Image intensifiers (IIs)
IIs produce high-contrast images under dark conditions. Suitable for night-time surveillance, as well as for scientific and technical research.
Hamamatsu Image intensifier (II) units
High-speed gated II units use gate (or shutter) operation to capture instantaneous images of high-speed phenomena occurring within extremely short time durations.
HAMAMATSU PHOTONICS
Colour sensor
Man Pt. No.: S9706
Manufacturer: Hamamatsu
IR phototransistor 850 nm 35 V
Man Pt. No.: S2829
Manufacturer: Hamamatsu
Light sensor, 0.07 ms, 2.2...7 V Digital Output
Man Pt. No.: S4810
Manufacturer: Hamamatsu
Gas sensor
Man Pt. No.: T11262-01
Manufacturer: Hamamatsu
Line sensor
Man Pt. No.: S10077
Manufacturer: Hamamatsu
Colour sensor
Man Pt. No.: S9702
Manufacturer: Hamamatsu
Line sensor
Man Pt. No.: S9226-03
Manufacturer: Hamamatsu
IR-LED 870 nm
Man Pt. No.: L 8957
Manufacturer: Hamamatsu
IR-LED 880 nm
Man Pt. No.: L 2791-02
Manufacturer: Hamamatsu
Ambient light sensor 560 nm
Man Pt. No.: S13948-01SB
Manufacturer: Hamamatsu
IR-photodiode 800nm, TO-18
Man Pt. No.: S12023-02
Manufacturer: Hamamatsu
IR-LED 940 nm
Man Pt. No.: L 5586
Manufacturer: Hamamatsu
IR-photodiode 960nm,
Man Pt. No.: S1337-66BR
Manufacturer: Hamamatsu
IR-photodiode 960nm, TO-18
Man Pt. No.: S1336-18BQ
Manufacturer: Hamamatsu
IR-photodiode 800nm, TO-18
Man Pt. No.: S2381
Manufacturer: Hamamatsu
IR-LED 900 nm Bullet Type
Man Pt. No.: L12170
Manufacturer: Hamamatsu
Light sensor, 4.5...12 V Light Modulation
Man Pt. No.: S4282-51
Manufacturer: Hamamatsu
Light sensor, 4.5...12 V Light Modulation
Man Pt. No.: S6846
Manufacturer: Hamamatsu
Light sensor, 4.5...12 V Light Modulation
Man Pt. No.: S7136
Manufacturer: Hamamatsu
Light sensor, 4.5...12 V Light Modulation
Man Pt. No.: S7136-10
Manufacturer: Hamamatsu
Light sensor, 0.15 nA, 1.5 ms Position Sensitive
Man Pt. No.: S3931
Manufacturer: Hamamatsu
Hamamatsu C12880MA u-Spectrometer
Man Pt. No.: 114991292
Manufacturer: Seeed Studio
IR-LED 940 nm
Man Pt. No.: L 6286
Manufacturer: Hamamatsu
Ambient light sensor 560 nm Radial
Man Pt. No.: S9648-100
Manufacturer: Hamamatsu
IR-photodiode 760nm, Radial
Man Pt. No.: S10784
Manufacturer: Hamamatsu
Ambient light sensor 560 nm Reel, SIP
Man Pt. No.: S9066-211SB
Manufacturer: Hamamatsu
CMOS linear image sensor
Man Pt. No: S15611
Manufacturer: Hamamatsu
40 MHz operation, digital output
The S15611 is a CMOS linear image sensor that has achieved a readout speed of 40 MHz max. and a line rate of 34 kHz max.
The image sensor has a timing generator, bias generator, 12-bit A/D converter, and is easy to handle because of its digital I/O.
CMOS linear image sensor
Man Pt. No: S10226-10
Manufacturer: Hamamatsu
Small, resin-sealed CMOS image sensor
Features
-Compact and high cost-performance
-Pixel pitch: 7.8 μm Pixel height: 125 μm
-1024 pixels
-Single 3.3 V power supply operation
-High sensitivity, low dark current, low noise
-On-chip charge amplifier with excellent input/output characteristics
-Built-in timing generator allows operation with only Start and Clock pulse inputs
-Video data rate: 200 kHz max.
-Spectral response range: 400 to 1000 nm
Photomultiplier tube
Manufacturer: Hamamatsu
Man Pt. No: R6237-01
76 x 76 mm Rectangular, Head-on type, Bialkali photocathode, Spectral response : 300 to 650 nm), for Gamma camera, Semiflexible lead type of R6237
Hamamatsu Multıanode Photomultıplıer Tube Assembly H12700A
64ch multianode PMT assembly H12700A
52 x 52 mm PMT assembly, Built-in PMT : R12699-00-M64
H12700A series / H14220A : Cable input type
H12700B series / H14220B : Connector input type
H12700A / H12700A-10 : 300 nm to 650 nm
H12700A-03 : 185 nm to 650 nm
H14220A : 300 nm to 700 nm
Hamamatsu Multıanode Photomultıplıer Tube H14220A
64ch multianode PMT assembly
H14220A
52 x 52 mm PMT assembly, Built-in PMT : R14219
H12700A series / H14220A : Cable input type
H12700B series / H14220B : Connector input type
H12700A / H12700A-10 : 300 nm to 650 nm
H12700A-03 : 185 nm to 650 nm
H14220A : 300 nm to 700 nm
Hamamatsu Pulsed Laser Diode L11854-307-05
Hamamatsu Pulsed Laser Diode L11854-307-55
Hamamatsu Pulsed Laser Diode L11854-336-05
Hamamatsu Pulsed Laser Diode L11854-323-51
Hamamatsu Laser Dıode TL90AT08
Hamamatsu L2273 Xenon Lamp
Hamamatsu L2174-01 Xenon Lamp
Hamamatsu Photosensor Module Wıth Pmt H11902-04
Hamamatsu Cameras
Hamamatsu qCMOS cameras
Qcmos Camera C15550-20UP
The world's first camera to incorporate the qCMOS image sensor.
ORCA-Quest qCMOS camera: C15550-20UP
The C15550-20UP is the world's first camera to incorporate the qCMOS image sensor. The camera achieves the ultimate in quantitative imaging.
C15550-20UP Catalog
Hamamatsu CMOS cameras
A measurement camera which incorporates a CMOS sensor for scientific research use.
ORCA-Fire Digital CMOS camera C16240-20UP
The ORCA-Fire intelligently integrates all the essential elements of a high performance, back-thinned, scientific CMOS (sCMOS) camera.
ORCA-Flash4.0 LT3 Digital CMOS camera: C11440-42U40
The ORCA-Flash4.0 LT3 is a new scientific CMOS camera for fluorescence imaging, which has been improved from the ORCA-Flash 4.0 released in
ORCA-Lightning Digital CMOS camera: C14120-20P
Compared to a Gen II sCMOS, the ORCA-Lightning delivers 2 times the pixel area, 2.8 times the pixels and 3.4 times faster pixel-per-second readout.
ORCA-Fusion Digital CMOS camera: C14440-20UP
The ORCA-Fusion, built from the sensor up, balances the complex nuances of camera features to provide beautiful images and robust data at all lights levels, but especially in tough low-light conditions.
ORCA-Fusion BT Digital CMOS camera: C15440-20UP
The ORCA-Fusion BT camera is the pinnacle of scientific CMOS (sCMOS) performance. The specifications are without compromise: ultra-low readout noise, CCD-like uniformity, fast frame rates and back-thinned enabled high QE.
ORCA-spark Digital CMOS camera: C11440-36U
The ORCA-spark is a high-sensitivity digital CMOS camera using a 2.3 megapixel CMOS sensor.
ORCA-Flash4.0 V3 Digital CMOS camera: C13440-20CU
Digital CMOS camera with sCMOS sensor designed for scientific research use. It has improved resolution and sensitivity (especially in NIR region) comparing with ORCA-Flash4.0. (82 % peak QE)
Hamamatsu CCD cameras
A measurement camera which incorporates a high-sensitive CCD sensor.
ORCA Ⅱ Digital CCD camera: C11090-22B
Digital CCD
Wide spectral sensitive (UV to NIR) back-thinned CCD digital camera. Peltier cooling reduces dark current, and it allows to have long exposure
A measurement camera which incorporates a EM-CCD sensor.
ImagEM X2 EM-CCD camera: C9100-23B
Electron Multiplying CCD camera with back-thinned type EM-CCD. The heavy cooled (-100 ℃) high sensitive camera realizes 512×512 pixel read out speed of 70 frames second
ImagEM X2-1K EM-CCD camera: C9100-24B
Electron Multiplying CCD camera with back-thinned type EM-CCD. The heavy cooled (-80 ℃) high sensitive camera realizes 1024×1024 pixel read out speed of 18.5 frames second.
Hamamatsu InGaAs cameras
A measurement camera which incorporates a InGaAs sensor for measurement near-infrared wavelength.
InGaAs line scan camera: C15333-10E
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950 nm - 1700 nm
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GigE Vision
Infrared sensitive InGaAs camera with detection range from 950 nm to 1700 nm. It supports in-line non-destructive inspection in real time.
In addition, it employs Gigabit Ethernet interfaces and it supports GigE Vision
InGaAs camera: C12741-03
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950 nm - 1700 nm
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USB 3.0
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EIA
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Cooled model
Infrared sensitive InGaAs camera with detection range from 950nm to 1700nm. It supports standard video output (EIA) and USB 3.0.
InGaAs camera: C12741-11
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950 nm - 1500 nm
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CameraLink
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Cooled model
Infrared sensitive InGaAs camera with detection range from 950nm to 1500nm. Low dark current with -70 °C peltier cooling.
InGaAs camera: C14041-10U
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950 nm - 1700 nm
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USB 3.0
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Cooled model
Infrared sensitive InGaAs camera with detection range from 950nm to 1700nm. It supports standard video output USB 3.0.
Time-delayed integration (TDI) cameras are a special implementation of CCDs for high speed, low light OEM applications.
TDI camera: C10000-801
TDI (Time Delay Integration) camera with 2048 horizontal pixel. It realizes high speed and high sensitivity simultaneously and is good for variety of applications including in-line use.
Hamamatsu Board level cameras
Hamamatsu Board-level CMOS cameras
These easy-to-integrate, small form factor, streamlined cameras are ideal for OEM applications that demand both high performance and cost effectiveness.
Scientific CMOS board level camera: C11440-62U
Board type camera for OEM with the Gen II scientific CMOS sensor.It can be customized upon request.
Scientific CMOS board level camera: C11440-52U30
Board type camera for OEM with the Gen II scientific CMOS sensor.It can be customized upon request.
Digital CMOS board level camera: C13752-50U
Board type camera for OEM with the Gen II scientific CMOS sensor.It can be customized upon request.
Digital CMOS board level camera: C13770-50U
Board type camera for OEM with the Gen II scientific CMOS sensor.It can be customized upon request.
Digital CMOS board level camera: C13949-50U
Board type camera for OEM with the Gen II scientific CMOS sensor.It can be customized upon request.
Hamamatsu Board-level TDI cameras
Our board-level cameras provide a space- and cost-effective way to integrate TDI performance into an OEM instrument.
TDI board level camera: C10000-A01
TDI board-level camera is useful for a wide range of imaging applications requiring high speed operation with high sensitivity.
Hamamatsu X-ray line scan cameras
X-ray line scan cameras
X-ray line scan cameras produce high-sensitivity, high-resolution, X-ray transmission images of moving objects transported on a conveyor belt or similar apparatus. These cameras are suitable for inspecting the inside of an object without causing damage, for example, detecting foreign bodies mixed in food, quality of electronic components, and completeness of assemblies and packaging.
X-ray line scan camera: C14960-14C
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Thin sample inspection
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Thick sample inspection
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Camera Link
X-ray line scan camera with detection width of 819.2 mm and line speed from 4 m to 100 m/minute. It is good for nondestructive testing of objects on belt conveyers.
X-ray line scan camera: C14960-16C
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Thin sample inspection
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Thick sample inspection
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Camera Link
X-ray line scan camera with detection width of 819.2 mm and line speed from 4 m to 100 m/minute. It is good for nondestructive testing of objects on belt conveyers.
X-ray line scan camera: C14960-18C
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Thin sample inspection
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Thick sample inspection
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Camera Link
X-ray line scan camera with detection width of 819.2 mm and line speed from 4 m to 100 m/minute. It is good for nondestructive testing of objects on belt conveyers.
X-ray line scan camera: C14300-05U
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Thin sample inspection
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Thick sample inspection
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USB 3.0
X-ray line scan camera with detection width of 256 mm and line speed from 4 m to 200 m/minute. It is good for nondestructive testing of objects on belt conveyers.
X-ray line scan camera: C14300-08U
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Thin sample inspection
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Thick sample inspection
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USB 3.0
X-ray line scan camera with detection width of 409.6 mm and line speed from 4 m to 200 m/minute. It is good for nondestructive testing of objects on belt conveyers.
X-ray line scan camera: C14300-12U
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Thin sample inspection
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Thick sample inspection
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USB 3.0
X-ray line scan camera with detection width of 614.4 mm and line speed from 4 m to 200 m/minute. It is good for nondestructive testing of objects on belt conveyers.
Hamamatsu C-shaped X-ray line scan cameras
C-shaped X-ray line scan cameras meet the demands of tire inspection. As the tire completes one revolution, an image with 3456-pixel horizontal resolution and no gap (<1 pixel) in the entire effective area is generated. High sensitivity and wide dynamic range provide fast and excellent detectability of defects for reliable inspection.
X-ray line scan camera: C12450-27FGC-C
X-ray line scan camera for nondestructive testing to be used for high speed tire inspection and quality control. (Applicable line speeds: 4 m/min to 120 m/min)
X-ray line scan camera: C12450-27FGC-G
X-ray line scan camera for nondestructive testing to be used for high speed tire inspection and quality control. (Applicable line speeds: 4 m/min to 120 m/min)
Hamamatsu Dual energy X-ray line scan cameras
High-speed, high-resolution dual energy X-ray line scan cameras can be used to effectively differentiate materials in a variety of nondestructive testing applications. By using a selection of scintillator, filter, and gain factor options, it is possible to optimize the camera for X-ray conditions from high-energy to middle- or low-energy ranges. This maximizes object differentiation over a variety of materials.
Dual energy X-ray line scan camera: C11800-08U
C11800-08U is an X-ray line sensor camera that covers the detection of low-density contaminant and thin contaminant. (It has 0.4 mm detection pitch and sensitivity from 25 kV to 160 kV).
Dual energy X-ray line scan camera: C11800-09U
C11800-09U is an X-ray line sensor camera that covers the detection of low-density contaminant and thin contaminant. (It has 0.4 mm detection pitch and sensitivity from 25 kV to 160 kV).
Hamamatsu X-ray TDI cameras
X-ray TDI cameras useful for in-line imaging applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C12300-121
Evolutional high speed scanning with TDI technology. Bidirectional scanning operation is supported.
X-ray TDI camera: C12300-323
Evolutional high speed scanning with TDI technology. Bidirectional scanning operation is supported.
X-ray TDI camera: C12300-321
Evolutional high speed scanning with TDI technology. Bidirectional scanning operation is supported.
X-ray TDI camera: C12300-321B
Evolutional high speed scanning with TDI technology. Bidirectional scanning operation is supported.
X-ray TDI camera: C12300-322
Evolutional high speed scanning with TDI technology. Bidirectional scanning operation is supported.
X-ray TDI camera: C12300-461B
Evolutional high speed scanning with TDI technology. Bidirectional scanning operation is supported.
X-ray TDI camera: C15400-30-50A
C15400-30-50A enables you to obtain high-contrast images in inspecting those materials even with low energy X-ray.
X-ray TDI camera: C10650-221
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity. (Standard type)
X-ray TDI camera: C10650-261
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Horizontal chassis
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Overlap type
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-261V
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Vertical chassis
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Overlap type
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-261W
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Vertical chassis
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Overlap type
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2 cameras output
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-321
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity. (Standard type)
X-ray TDI camera: C10650-361
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Horizontal chassis
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Overlap type
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-361V
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Vertical chassis
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Overlap type
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-361W
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Vertical chassis
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Overlap type
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2 cameras output
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-461
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Horizontal chassis
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Overlap type
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-461V
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Vertical chassis
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Overlap type
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray TDI camera: C10650-461W
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Vertical chassis
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Overlap type
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2 cameras output
X-ray TDI camera is useful for in-line applications requiring high-speed operation with high sensitivity.
X-ray CMOS cameras are suitable for micro object by achieving high resolution image.
- X-ray I.I. camera unit & X-ray I.I.
X-ray camera units those contain an X-ray image intensifier and a CCD camera.
- High resolution X-ray imaging system:
High resolution X-ray imaging systems consist of a scintillator unit and high sensitive camera. Wide range of products are available for various applications.
Hamamatsu X-ray CMOS cameras
X-ray CMOS cameras are suitable for micro object by achieving high resolution image.
ORCA-Lightning X X-ray sCMOS camera: C15606-101P
This is a X-ray sCMOS camera with a wide field of view (25.344 mm × 14.256mm), a high resolution of 12 million pixels, and a high readout speed of 121 frames/s. (scintillator: GOS(P43) 10 μm)
ORCA-Lightning X X-ray sCMOS camera: C15606-102P
This is a X-ray sCMOS camera with a wide field of view (25.344 mm × 14.256mm), a high resolution of 12 million pixels, and a high readout speed of 121 frames/s. (scintillator: GOS(P43) 20 μm)
DX-CUBE: H8953-30 is a compact X-ray CMOS camera for non-destructive inspection, which uses a consumer CMOS camera in combination with our high-sensitivity CsI scintillator.
Compact X-ray CMOS camera: H8953-30
DX-CUBE: H8953-30 is a compact X-ray CMOS camera for non-destructive inspection, which uses a consumer CMOS camera in combination with our high-sensitivity CsI scintillator.
X-ray sCMOS camera: C12849-111U
High resolution and high sensitivity X-ray sCMOS camera. (Scintillators: GOS(P43) 10 μm) Also the product is compact that is suitable as embedded devices for Micro CT/Nano CT system.
Hamamatsu X-ray I.I. camera unit & X-ray I.I.
X-ray camera units those contain an X-ray image intensifier and a CCD camera.
X-ray image intensifier camera unit: C7336-06
Camera units C7336-06 consist of a high resolution, high contrast 4-inch X-ray image intensifier (X-ray I.I.) and a 2.35 mega-pixel CMOS image sensor.The X-ray I.I. has an input window made of thin aluminum which is excellent in X-ray transmission and causes less scattering of X-rays. These features allow real-time detection at X-ray energy levels from about 20 keV.
X-ray image intensifier camera unit: C7336-07
Camera units C7336-07 consist of a high resolution, high contrast 4-inch X-ray image intensifier (X-ray I.I.) and a 3 mega-pixel CMOS image sensor. The X-ray I.I. has an input window made of thin aluminum which is excellent in X-ray transmission and causes less scattering of X-rays. These features allow real-time detection at X-ray energy levels from about 20 keV.
X-ray image intensifier tube: V10905P-01
High-voltage power supply built-in X-ray I.I. having variable field of view of 4 inch / 2 inch with the high resolution and high contrast. It's used for off-line and in-line test of products by an X-ray perspective imege of industrial goods.
Hamamatsu High resolution X-ray imaging system
High-resolution imaging system designed for X-ray beam alignment. Suitable for use in larger synchrotron radiation facilities.
High resolution X-ray imaging system:
High resolution X-ray imaging systems consist of a scintillator unit and high sensitive camera. Wide range of products are available for various applications.
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