Since 1976 Reltech Limited has served the global semiconductor industry, providing both innovative Burn-In/Life-Test Systems and Reliability and Qualification testing services to industry leading Fabless and OEM semiconductor companies. Our vast experience in system design and manufacture and reliability testing, enables us to offer our customers full turn-key solutions covering all aspects of Semiconductor reliability including qualification planning, test hardware design and manufacture, test software development and the complete qualification testing of our customer products. All testing is performed to industry and customer specific standards and is supported by highly trained and competent personnel, assuring users of the up-most integrity and confidentiality at all times.
Reltech Limited Independent Test Laboratory
Reltech Limited founded in 1976 is an Independent Test Laboratory, Burn-In and HTOL system manufacturer serving the Semiconductor and Microelectronics industries
Reltech Limited HTOL System
Reltech 7000 Series HTOL System
7000 Series
Reltech HTOL systems – changing concepts
With ever decreasing geometries, the way we perform HTOL requires careful consideration.
In lower geometry device leakage currents are not only higher but vary greatly.
Temperature control at DUT level – required to achieve correct junction temperature at every DUT.
For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly.
Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
Reltech 7121 HTOL system
21 HTOL Trays per chamber
2.5m/s airflow high power
< 5W HTOL application
Up to 5 HTOL Lots per chamber
192 I/O’s per Tray
5 voltage rails per tray
Easy access to Driver Card at front of chamber
Lattice front – flexible load/unload timing
Driver Cards – Digital/Analogue/Mixed signal
Standard or application specific
DUT monitoring and logging via PC and MIDAS software
HTOL Mother/Daughter board
HTOL Board with Dynamic Driver Card
8000 Series
Today’s low geometry semiconductor devices require a different approach to performing High Temperature Operating Life (HTOL) and “Burn-In”. Core Leakage currents vary greatly between device die, even when from the same wafer, and are significantly higher than those of larger geometry devices. These leakage currents result in self-heating within the device and increased junction temperatures (Tj). In order to control the junction temperature to within acceptable limits and to increase product yield, it is necessary to control the temperature of each device independently. This is not possible in conventional chamber based HTOL systems. The Reltech independent Test Laboratory is pleased to announce the latest addition to its portfolio of semiconductor qualification test systems. The Reltech 8000 series HTOL system incorporating iSocket™ technology, provides the highest level of thermal control possible for High Temperature Operating Life Testing and Burn-In of the very latest low geometry, high power semiconductor devices.
8014 HTOL System Features:
iSocketTM Technology
Open Rack-Room Temperature (RTBI) non chamber design
High Power DUT Capability – 0-65W
Individual DUT Temperature Measurement & Control
DUT Monitoring with Auto shut down
28 BIB capacity – 14 trays 2 BIB’s per tray
Multi DUT type HTOL Testing
Remote System & HTOL Monitoring – Customer access via VPN
Driver Performance:
Vector Channels: 64
Max Vector Frequency (recommended):20MHz
DUT Monitor Channels:60
Reltech 9000 Ultra High Power HTOL Systems
9000 Data Sheet
As the world becomes further connected, the infrastructure that supports this world is becoming increasingly complex and demands semiconductor devices with very powerful processing capability.
Artificial Intelligence (AI) is at the forefront of many organizations’ development and the success of AI depends heavily on storage, communication speed, networking, and ultimately very powerful processing capabilities. The critical nature of these data crunching, power hungry processors relies that not a single error or misstep occurs, which is driving equipment that handle the devices as if they are in the final application.
The accelerated life testing of these devices is driving the need for more advanced test systems and equipment capable of handling very high power operation surpassing the capabilities of conventional High Temperature Operating Life (HTOL) or Burn-in systems using traditional air convection methods for temperature control.
Reltech Limited is pleased to announce the latest addition to its portfolio of semiconductor qualification test systems. The Reltech 9000 series HTOL system, developed in conjunction with Sensata Technologies and incorporates the very latest in Sensata’s Qinex iSocket™ technology with liquid thermal control, controlling devices with up to 800W dissipation
Reltech Limited HTOL Driver Cards
A wide range of Driver card are available suitable for HTOL, THB, LTOL, and HAST test applications. All device technologies are catered for whether it be Digital , Analogue, Mixed Signal, low voltage <0.5v, high voltage >>3KV.
* The following driver card overview is an example from our standard range of driver cards and demonstrates some of the typical specifications available. Bespoke designed driver card to suit customer’s individual requirements are also available.
Typical Advanced Mixed Signal Driver Card
7000 and 8000 HTOL System compatible
64 Digital Vector Channels
60 DUT Output Monitor Channels
1 Analogue Output Channel
64Mb Vector Memory Depth
Vih Level: 1.0 – 5.0v
Vector Looping – 2 Loops – infinite or repeat count
6 Power Supply Outputs
Qualification Hardware & Sockets
Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include:
- HTOL Boards (Mother and Daughter cards)
- Burn-In Boards
- HAST Boards
- THB (humidity) Boards
- Burn-In Modules and frames
- Dynamic Driver cards (Digital, Analogue and Mixed signal)
- Back Planes
- Voltage regulator cards
- Custom electro-mechanical assemblies
- DUT Cassettes and test Fixtures
The integrity and performance of test hardware is one of the most important aspects of the semiconductor device test and qualification process. The interface hardware needs to be of the highest performance capability, providing consistent and repeatable test results, with the ability to withstand stringent environment test conditions including operating temperatures to +300°C, relative humidity to 95% , atmospheric pressure to 33psia and allow clock and signal speeds up to 100MHz with signal integrity and minimum distortion.
Reltech employ the latest PCB design CAD software for the design of its hardware and are engaged with technology leading PCB manufacturing specialists adopting the most advanced technologies available.
- Multilayer designs – + 20 layer
- Copper filled flat pad technology
- Buried laser drilled micro- via holes
- 2 thou (0.05mm) track and gap geometry
- > 0.3mm pitch WLCSP, micro BGA, QFN socket compatible
Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
Reltech works closely with all of the industry leading socket manufacturers and has a vast amount of experience in test socket technology, enabling you to receive the best advice and ensure correct selection of the socket most suited to your test needs; assuring you of a high level of performance to withstand even the most hostile test environments.
A wide range of test sockets are available offering a multitude of different socket styles to suit leading edge package technologies, including fine pitch flip chip Ball Grid Array (FCBGA), CSP (Chip Scale Package), QFN, TSSOP, TQFP, SOP and all other semiconductor package styles.
Reltech also provides burn-test socket “iSocket” solutions with active temperature DUT control.
Türkiyede Reltech Limited ürün ile ilgili uygun rekabetçi fiyatları almak için müşteri temsilcimizle http://www.imajteknik.com.tr/bize-ulasin veya Fiyat teklifi formunu ( http://www.imajteknik.com.tr/online-iletisim-formu ) doldurarak mesaj bırakmanız halinde satış mühendislerimiz en kısa zamanda sizinle irtibat kuracaklardır.